Robust design of circuits susceptible to electromigration

D.C.L. van Geest, A.C. Brombacher, O.E. Herrmann

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	ESREF'92
Place of Publication	Schwabisch Gmund, Deutschland
Pages	197-200
Number of pages	4
Publication status	Published - 5 Oct 1992

Keywords

@inproceedings{74d5d48549c24bb49d8a087d2b03d538,

title = "Robust design of circuits susceptible to electromigration",

keywords = "METIS-113116",

author = "\{van Geest\}, D.C.L. and A.C. Brombacher and O.E. Herrmann",

year = "1992",

month = oct,

day = "5",

language = "Undefined",

isbn = "3-8007-1886-3",

pages = "197--200",

booktitle = "ESREF'92",

}