| Original language | Undefined |
|---|---|
| Title of host publication | Reliability Symposium of the Eindhoven micro-centrum |
| Place of Publication | Eindhoven |
| Pages | - |
| Number of pages | 0 |
| Publication status | Published - 29 Nov 1990 |
Keywords
- METIS-113126
Robust design of elctronic circuits
A.C. Brombacher
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review