Abstract
A robust process-controller was developed which maintains a fully penetrated weld. This feedback-controller is robust for various process disturbances that may occur, like variations in sheet thickness, welding velocity, focal position, shielding gas variations, etc. The signals from an optical sensor are used to design a so-called "switching" controller, which enables fully penetrated welding at a minimum amount of laser power. It is shown that the working principle of the controller is applicable to different material types, more specific different steels and stainless steels. Experiments have been carried out to show the ability to cope with varying sheet thickness and
welding velocity on FeP04 mild steel. Furthermore a method is described which can be used to easily find a good set of control parameters from a single identification experiment.
| Original language | Undefined |
|---|---|
| Title of host publication | Proceedings 24th International Congress on Applications of Lasers & Electro-Optics 2005 (ICALEO '05), 31 October - 3 Nov 2005, Miami, USA |
| Editors | A Ostendorf, A. Hoult, Y. Lu |
| Place of Publication | Miami, USA |
| Publisher | LIA |
| Pages | 862-868 |
| Number of pages | 7 |
| ISBN (Print) | 0-912035-82-X |
| Publication status | Published - 31 Oct 2005 |
| Event | 24th International Congress on Applications of Lasers & Electro-Optics, ICALEO 2005 - Miami, United States Duration: 31 Oct 2005 → 3 Nov 2005 Conference number: 24 |
Publication series
| Name | |
|---|---|
| Publisher | LIA |
Conference
| Conference | 24th International Congress on Applications of Lasers & Electro-Optics, ICALEO 2005 |
|---|---|
| Abbreviated title | ICALEO |
| Country | United States |
| City | Miami |
| Period | 31/10/05 → 3/11/05 |
Keywords
- IR-52897
- METIS-224872
Cite this
de Graaf, M. W., Olde Benneker, J., Aarts, R. G. K. M., Meijer, J., & Jonker, J. B. (2005). Robust process-controller for Nd:YAG welding. In A. Ostendorf, A. Hoult, & Y. Lu (Eds.), Proceedings 24th International Congress on Applications of Lasers & Electro-Optics 2005 (ICALEO '05), 31 October - 3 Nov 2005, Miami, USA (pp. 862-868). Miami, USA: LIA.