Fingerprint
Dive into the research topics of 'Roughness evolution of Si surfaces upon Ar ion erosion'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Roughness evolution of Si surfaces upon Ar ion erosion
V.I.T.A. de Rooij-Lohmann, I.V. Kozhevnikov, L. Peverini, E. Ziegler, R. Cuerno, Frederik Bijkerk, Andrey Yakshin
Research output: Contribution to journal › Article › Academic › peer-review
12
Citations
(Scopus)
3
Downloads
(Pure)