RTP damage anneal studied by X-ray diffraction

J.G.E. Klappe, I. Barsony, Hans Wallinga

    Research output: Contribution to conferencePoster

    Original languageUndefined
    Pages-
    Publication statusPublished - 19 Nov 1991
    EventIOP/FOM Werkgemeenschap Halfgeleiders 1991 - Veldhoven, Netherlands
    Duration: 19 Nov 199120 Nov 1991

    Conference

    ConferenceIOP/FOM Werkgemeenschap Halfgeleiders 1991
    CountryNetherlands
    CityVeldhoven
    Period19/11/9120/11/91

    Keywords

    • METIS-117172

    Cite this

    Klappe, J. G. E., Barsony, I., & Wallinga, H. (1991). RTP damage anneal studied by X-ray diffraction. -. Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.
    Klappe, J.G.E. ; Barsony, I. ; Wallinga, Hans. / RTP damage anneal studied by X-ray diffraction. Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.
    @conference{dee99004dfc64dc683d88a34dfcc6e0c,
    title = "RTP damage anneal studied by X-ray diffraction",
    keywords = "METIS-117172",
    author = "J.G.E. Klappe and I. Barsony and Hans Wallinga",
    year = "1991",
    month = "11",
    day = "19",
    language = "Undefined",
    pages = "--",
    note = "null ; Conference date: 19-11-1991 Through 20-11-1991",

    }

    Klappe, JGE, Barsony, I & Wallinga, H 1991, 'RTP damage anneal studied by X-ray diffraction' IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands, 19/11/91 - 20/11/91, pp. -.

    RTP damage anneal studied by X-ray diffraction. / Klappe, J.G.E.; Barsony, I.; Wallinga, Hans.

    1991. - Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.

    Research output: Contribution to conferencePoster

    TY - CONF

    T1 - RTP damage anneal studied by X-ray diffraction

    AU - Klappe, J.G.E.

    AU - Barsony, I.

    AU - Wallinga, Hans

    PY - 1991/11/19

    Y1 - 1991/11/19

    KW - METIS-117172

    M3 - Poster

    SP - -

    ER -

    Klappe JGE, Barsony I, Wallinga H. RTP damage anneal studied by X-ray diffraction. 1991. Poster session presented at IOP/FOM Werkgemeenschap Halfgeleiders 1991, Veldhoven, Netherlands.