Ruggedness of Silicon Power MOSFETs–Part II: Device Design Failures and Modeling: A Review

R. Tambone, A. Ferrara, R. Siemieniec, A. Wood, F. Magrini, R. J. E. Hueting

Research output: Contribution to journal › Article › Academic › peer-review

1 Citation (Scopus)
29 Downloads (Pure)

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