Rule-driven mixed-signal test generation

V. Kaal, Hans G. Kerkhoff, M. Sachdev

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE International Mixed-Signal Testing Workshop
    Place of PublicationVillard de Lans, France
    Pages148-152
    Publication statusPublished - 19 Jun 1995

    Keywords

    • METIS-112957

    Cite this

    Kaal, V., Kerkhoff, H. G., & Sachdev, M. (1995). Rule-driven mixed-signal test generation. In Proceedings of the IEEE International Mixed-Signal Testing Workshop (pp. 148-152). Villard de Lans, France.
    Kaal, V. ; Kerkhoff, Hans G. ; Sachdev, M. / Rule-driven mixed-signal test generation. Proceedings of the IEEE International Mixed-Signal Testing Workshop. Villard de Lans, France, 1995. pp. 148-152
    @inproceedings{54b923a1843044c790135b8c844d82b0,
    title = "Rule-driven mixed-signal test generation",
    keywords = "METIS-112957",
    author = "V. Kaal and Kerkhoff, {Hans G.} and M. Sachdev",
    year = "1995",
    month = "6",
    day = "19",
    language = "Undefined",
    pages = "148--152",
    booktitle = "Proceedings of the IEEE International Mixed-Signal Testing Workshop",

    }

    Kaal, V, Kerkhoff, HG & Sachdev, M 1995, Rule-driven mixed-signal test generation. in Proceedings of the IEEE International Mixed-Signal Testing Workshop. Villard de Lans, France, pp. 148-152.

    Rule-driven mixed-signal test generation. / Kaal, V.; Kerkhoff, Hans G.; Sachdev, M.

    Proceedings of the IEEE International Mixed-Signal Testing Workshop. Villard de Lans, France, 1995. p. 148-152.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Rule-driven mixed-signal test generation

    AU - Kaal, V.

    AU - Kerkhoff, Hans G.

    AU - Sachdev, M.

    PY - 1995/6/19

    Y1 - 1995/6/19

    KW - METIS-112957

    M3 - Conference contribution

    SP - 148

    EP - 152

    BT - Proceedings of the IEEE International Mixed-Signal Testing Workshop

    CY - Villard de Lans, France

    ER -

    Kaal V, Kerkhoff HG, Sachdev M. Rule-driven mixed-signal test generation. In Proceedings of the IEEE International Mixed-Signal Testing Workshop. Villard de Lans, France. 1995. p. 148-152