Rule-driven mixed-signal test generation

V. Kaal, Hans G. Kerkhoff, M. Sachdev

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE International Mixed-Signal Testing Workshop
    Place of PublicationVillard de Lans, France
    Pages148-152
    Publication statusPublished - 19 Jun 1995

    Keywords

    • METIS-112957

    Cite this

    Kaal, V., Kerkhoff, H. G., & Sachdev, M. (1995). Rule-driven mixed-signal test generation. In Proceedings of the IEEE International Mixed-Signal Testing Workshop (pp. 148-152). Villard de Lans, France.