SANA experiments on thin CoCr films with perpendicular domain structure

M.Th. Rekveldt, C.M.E. Zeyen, J.C. Lodder, W.H. Kraan

    Research output: Contribution to journalArticleAcademicpeer-review

    4 Citations (Scopus)
    38 Downloads (Pure)

    Abstract

    The application of small angle neutron scattering in the study of thin magnetic layers used in perpendicular recording media has been demonstrated. The domain structure in these materials is characterized by the domain height perpendicular to the film and the domain width in the plane of the film. These quantities have been deduced from the two dimensional scattering pattern. The domain height is found from the momentum dependence of the anisotropy of the scattering where the film normal makes an angle of θ degrees with the beam direction. The domain width in the plane of the film has been analysed from the scattering profile itself. In principle also angular variations of the domain orientation may be analysed from the momentum dependence of the anisotropy.
    Original languageEnglish
    Pages (from-to)110-117
    Number of pages8
    JournalJournal of magnetism and magnetic materials
    Volume78
    Issue number1
    DOIs
    Publication statusPublished - 1989

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • SMI-MAT: MATERIALS

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