Scan Chain Optimization for Asynchronous Circuits

F.J. te Beest, A. Peeters, Hans G. Kerkhoff, K. van Berkel

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings Prorisc workshop
    Place of PublicationVeldhoven, The Netherlands
    Pages288-294
    Number of pages7
    Publication statusPublished - 29 Nov 2002

    Keywords

    • METIS-207547

    Cite this