Scan Chain Optimization for Asynchronous Circuits

F.J. te Beest, A. Peeters, Hans G. Kerkhoff, K. van Berkel

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings Prorisc workshop
    Place of PublicationVeldhoven, The Netherlands
    Number of pages7
    Publication statusPublished - 29 Nov 2002


    • METIS-207547

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