Scan Test Strategy for Asynchronous-Synchronous Interfaces

    Research output: Contribution to journalArticleAcademicpeer-review

    Original languageUndefined
    Pages (from-to)639-645
    Number of pages7
    JournalJournal of electronic testing
    VolumeSept 2004
    Publication statusPublished - 2004

    Keywords

    • METIS-218933

    Cite this

    @article{24676739a5474dd29f3a628f5abce410,
    title = "Scan Test Strategy for Asynchronous-Synchronous Interfaces",
    keywords = "METIS-218933",
    author = "O. Petre and Kerkhoff, {Hans G.}",
    year = "2004",
    language = "Undefined",
    volume = "Sept 2004",
    pages = "639--645",
    journal = "Journal of electronic testing",
    issn = "0923-8174",
    publisher = "Springer",

    }

    Scan Test Strategy for Asynchronous-Synchronous Interfaces. / Petre, O.; Kerkhoff, Hans G.

    In: Journal of electronic testing, Vol. Sept 2004, 2004, p. 639-645.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - Scan Test Strategy for Asynchronous-Synchronous Interfaces

    AU - Petre, O.

    AU - Kerkhoff, Hans G.

    PY - 2004

    Y1 - 2004

    KW - METIS-218933

    M3 - Article

    VL - Sept 2004

    SP - 639

    EP - 645

    JO - Journal of electronic testing

    JF - Journal of electronic testing

    SN - 0923-8174

    ER -