Scan Testing of Ansynchronous Circuits

F.J. te Beest

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationEindhoven, The Netherlands
    Publication statusPublished - 27 Jan 2000

    Keywords

    • METIS-114797

    Cite this

    te Beest, F. J. (2000, Jan 27). Scan Testing of Ansynchronous Circuits. Eindhoven, The Netherlands.
    te Beest, F.J. / Scan Testing of Ansynchronous Circuits. 2000. Eindhoven, The Netherlands.
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    title = "Scan Testing of Ansynchronous Circuits",
    keywords = "METIS-114797",
    author = "{te Beest}, F.J.",
    year = "2000",
    month = "1",
    day = "27",
    language = "Undefined",
    type = "Other",

    }

    te Beest, FJ 2000, Scan Testing of Ansynchronous Circuits. Eindhoven, The Netherlands.

    Scan Testing of Ansynchronous Circuits. / te Beest, F.J.

    Eindhoven, The Netherlands. 2000, .

    Research output: Other contributionOther research output

    TY - GEN

    T1 - Scan Testing of Ansynchronous Circuits

    AU - te Beest, F.J.

    PY - 2000/1/27

    Y1 - 2000/1/27

    KW - METIS-114797

    M3 - Other contribution

    CY - Eindhoven, The Netherlands

    ER -