Scanning magneto-resistance microscopy with FIB trimmed yoke-type magneto-resistive tape heads

G.N. Phillips, M. Eisenberg, N. Persat, E.A. Draaisma, L. Abelmann, J.C. Lodder

    Research output: Contribution to journalArticleAcademicpeer-review

    1 Citation (Scopus)

    Abstract

    Scanning magneto-resistance microscopy has been performed with thin film yoke-type magneto-resistive tape heads possessing eight channels. The read flux guides of these channels have been trimmed down from 24 μm to widths varying between 5.5 μm and 148 nm by focused ion beam milling with Ga+ ions. Tracks written on ME tape with an untrimmed write channel have been successfully imaged with all the trimmed channels. A significant attenuation (>5%) of read-back voltage across the MR sensor is only observed for channels possessing flux guides trimmed by 77% to 5.5 μm. A 52% (6 dB) drop in read-back voltage is observed for a channel possessing a flux guide trimmed by 99.4% to 148 nm.
    Original languageEnglish
    Pages (from-to)34-38
    Number of pages5
    JournalSensors and actuators. A: Physical
    Volume91
    Issue number1-2
    DOIs
    Publication statusPublished - 2001

    Keywords

    • SMI-TST: From 2006 in EWI-TST
    • TST-uSPAM: micro Scanning Probe Array Memory
    • SMI-REC: RECORDING

    Fingerprint Dive into the research topics of 'Scanning magneto-resistance microscopy with FIB trimmed yoke-type magneto-resistive tape heads'. Together they form a unique fingerprint.

  • Cite this