Scanning Near-Field Ellipsometry Microscopy: Imaging Nanomaterials with Resolution Below the Diffraction Limit

D.D. Tranchida, J. Diaz, Peter Manfred Schön, Holger Schönherr, Gyula J. Vancso

Research output: Contribution to journal › Article › Academic › peer-review

12 Citations (Scopus)

Keywords

@article{42f14882646346c6931a1c0e1c116358,

title = "Scanning Near-Field Ellipsometry Microscopy: Imaging Nanomaterials with Resolution Below the Diffraction Limit",

keywords = "METIS-280575",

author = "D.D. Tranchida and J. Diaz and Sch{\"o}n, {Peter Manfred} and Holger Sch{\"o}nherr and Vancso, {Gyula J.}",

year = "2011",

doi = "10.1039/C0NR00530D",

language = "Undefined",

volume = "3",

pages = "133--139",

journal = "Nanoscale",

issn = "2040-3364",

publisher = "Royal Society of Chemistry",

}

TY - JOUR

T1 - Scanning Near-Field Ellipsometry Microscopy: Imaging Nanomaterials with Resolution Below the Diffraction Limit

AU - Tranchida, D.D.

AU - Diaz, J.

AU - Schön, Peter Manfred

AU - Schönherr, Holger

AU - Vancso, Gyula J.

PY - 2011

Y1 - 2011

KW - METIS-280575

U2 - 10.1039/C0NR00530D

DO - 10.1039/C0NR00530D

M3 - Article

SN - 2040-3364

VL - 3

SP - 133

EP - 139

JO - Nanoscale

JF - Nanoscale

ER -