Scanning Near-Field Ellipsometry Microscopy: Imaging Nanomaterials with Resolution Below the Diffraction Limit

D.D. Tranchida, J. Diaz, Peter Manfred Schön, Holger Schönherr, Gyula J. Vancso

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)
Original languageUndefined
Pages (from-to)133-139
Number of pages7
JournalNanoscale
Volume3
DOIs
Publication statusPublished - 2011

Keywords

  • METIS-280575

Cite this

Tranchida, D.D. ; Diaz, J. ; Schön, Peter Manfred ; Schönherr, Holger ; Vancso, Gyula J. / Scanning Near-Field Ellipsometry Microscopy: Imaging Nanomaterials with Resolution Below the Diffraction Limit. In: Nanoscale. 2011 ; Vol. 3. pp. 133-139.
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year = "2011",
doi = "10.1039/C0NR00530D",
language = "Undefined",
volume = "3",
pages = "133--139",
journal = "Nanoscale",
issn = "2040-3364",
publisher = "Royal Society of Chemistry",

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Scanning Near-Field Ellipsometry Microscopy: Imaging Nanomaterials with Resolution Below the Diffraction Limit. / Tranchida, D.D.; Diaz, J.; Schön, Peter Manfred; Schönherr, Holger; Vancso, Gyula J.

In: Nanoscale, Vol. 3, 2011, p. 133-139.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Scanning Near-Field Ellipsometry Microscopy: Imaging Nanomaterials with Resolution Below the Diffraction Limit

AU - Tranchida, D.D.

AU - Diaz, J.

AU - Schön, Peter Manfred

AU - Schönherr, Holger

AU - Vancso, Gyula J.

PY - 2011

Y1 - 2011

KW - METIS-280575

U2 - 10.1039/C0NR00530D

DO - 10.1039/C0NR00530D

M3 - Article

VL - 3

SP - 133

EP - 139

JO - Nanoscale

JF - Nanoscale

SN - 2040-3364

ER -