Scanning Near-Field Ellipsometry Microscopy: Imaging Nanomaterials with Resolution Below the Diffraction Limit

D.D. Tranchida, J. Diaz, Peter Manfred Schön, Holger Schönherr, Gyula J. Vancso

Research output: Contribution to journalArticleAcademicpeer-review

10 Citations (Scopus)
Original languageUndefined
Pages (from-to)133-139
Number of pages7
JournalNanoscale
Volume3
DOIs
Publication statusPublished - 2011

Keywords

  • METIS-280575

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