Scanning near field optical microscopy

M.H.P. Moers, R. Tack, N.F. van Hulst, B. Bölger

Research output: Contribution to conferencePosterOther research output

19 Citations (Scopus)
Original languageEnglish
Number of pages1
Publication statusPublished - 7 May 1993
EventNEVAC Scanning Probe Microscopy Symposium 1993 - AMOLF, Amsterdam, Netherlands
Duration: 7 May 19937 May 1993

Conference

ConferenceNEVAC Scanning Probe Microscopy Symposium 1993
Country/TerritoryNetherlands
CityAmsterdam
Period7/05/937/05/93

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