Scanning Probe Microscope

D.H.A. Blank (Inventor), A.J.H.M. Rijnders (Inventor), J.J. Broekmaat (Inventor), F.J.G. Roesthuis (Inventor)

Research output: Patent

Original languageEnglish
Patent numberUS 8,438,661 B2
Priority date7/05/13
Publication statusSubmitted - 7 May 2013

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