Scanning Probe Microscopy Markup Language

T. Bolhuis, J. Pasop, L. Abelmann, J.C. Lodder

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review


    The numerous, proprietary file formats for Scanning Probe Microscopy (SPM) have caused problems in the field of both off‐line quantitative, data analysis and comparison, as well as long‐term archiving of measurement results. Because of the eminent roll SPM’s are playing in the multidisciplinary scientific world of today, an open, XML‐based, standard SPM data format, called Scanning Probe Microscopy Markup Language (SPML) is proposed. XML (eXtensible Markup Language) has proven to be well applicable for standardized, structured, scientific data formats in many other disciplines. The structure of SPML will be explained briefly. The versatility of SPML as well as the possibilities of documenting, publishing, searching and exchanging SPM‐data will be shown in examples. This paper gives an overview of the proposed data format, while the complete description can be found at
    Original languageEnglish
    Title of host publicationScanning Tunneling Microscopy/Spectroscopy and Related Techniques
    Subtitle of host publication12th International Conference STM'03
    EditorsPaul M. Koenraad, Martijn Kemerink
    Place of PublicationNew York, NY
    PublisherAmerican Institute of Physics
    Number of pages8
    ISBN (Print)0-7354-0168-3
    Publication statusPublished - 20 Jul 2003
    Event12th International Conference on Scanning Tunneling Microscopy, STM 2003 - Eindhoven, Netherlands
    Duration: 20 Jul 200325 Jul 2003
    Conference number: 12

    Publication series

    NameAIP Conference Proceedings


    Conference12th International Conference on Scanning Tunneling Microscopy, STM 2003
    Abbreviated titleSTM


    Dive into the research topics of 'Scanning Probe Microscopy Markup Language'. Together they form a unique fingerprint.

    Cite this