Scanning Probe Microscopy Markup Language

T. Bolhuis; J. Pasop; L. Abelmann; J.C. Lodder

doi:10.1063/1.1639706

Scanning Probe Microscopy Markup Language

T. Bolhuis, J. Pasop, L. Abelmann, J.C. Lodder

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Abstract

The numerous, proprietary file formats for Scanning Probe Microscopy (SPM) have caused problems in the field of both off‐line quantitative, data analysis and comparison, as well as long‐term archiving of measurement results. Because of the eminent roll SPM’s are playing in the multidisciplinary scientific world of today, an open, XML‐based, standard SPM data format, called Scanning Probe Microscopy Markup Language (SPML) is proposed. XML (eXtensible Markup Language) has proven to be well applicable for standardized, structured, scientific data formats in many other disciplines. The structure of SPML will be explained briefly. The versatility of SPML as well as the possibilities of documenting, publishing, searching and exchanging SPM‐data will be shown in examples. This paper gives an overview of the proposed data format, while the complete description can be found at http://spml.net.

Original language	English
Title of host publication	Scanning Tunneling Microscopy/Spectroscopy and Related Techniques
Subtitle of host publication	12th International Conference STM'03
Editors	Paul M. Koenraad, Martijn Kemerink
Place of Publication	New York, NY
Publisher	American Institute of Physics
Pages	271-279
Number of pages	8
ISBN (Print)	0-7354-0168-3
DOIs	https://doi.org/10.1063/1.1639706
Publication status	Published - 20 Jul 2003
Event	12th International Conference on Scanning Tunneling Microscopy, STM 2003 - Eindhoven, Netherlands Duration: 20 Jul 2003 → 25 Jul 2003 Conference number: 12

Publication series

Name	AIP Conference Proceedings
Publisher	AIP
Volume	696

Conference

Conference	12th International Conference on Scanning Tunneling Microscopy, STM 2003
Abbreviated title	STM
Country/Territory	Netherlands
City	Eindhoven
Period	20/07/03 → 25/07/03

Access to Document

10.1063/1.1639706

Cite this

@inproceedings{7d9f48f221ed4451b8824a305ee8bcdb,

title = "Scanning Probe Microscopy Markup Language",

abstract = "The numerous, proprietary file formats for Scanning Probe Microscopy (SPM) have caused problems in the field of both off‐line quantitative, data analysis and comparison, as well as long‐term archiving of measurement results. Because of the eminent roll SPM{\textquoteright}s are playing in the multidisciplinary scientific world of today, an open, XML‐based, standard SPM data format, called Scanning Probe Microscopy Markup Language (SPML) is proposed. XML (eXtensible Markup Language) has proven to be well applicable for standardized, structured, scientific data formats in many other disciplines. The structure of SPML will be explained briefly. The versatility of SPML as well as the possibilities of documenting, publishing, searching and exchanging SPM‐data will be shown in examples. This paper gives an overview of the proposed data format, while the complete description can be found at http://spml.net.",

author = "T. Bolhuis and J. Pasop and L. Abelmann and J.C. Lodder",

note = "vastgelegd op CD-ROM; 12th International Conference on Scanning Tunneling Microscopy, STM 2003, STM ; Conference date: 20-07-2003 Through 25-07-2003",

year = "2003",

month = jul,

day = "20",

doi = "10.1063/1.1639706",

language = "English",

isbn = "0-7354-0168-3",

series = "AIP Conference Proceedings",

publisher = "American Institute of Physics",

pages = "271--279",

editor = "Koenraad, {Paul M.} and Martijn Kemerink",

booktitle = "Scanning Tunneling Microscopy/Spectroscopy and Related Techniques",

address = "United States",

}

Bolhuis, T, Pasop, J, Abelmann, L & Lodder, JC 2003, Scanning Probe Microscopy Markup Language. in PM Koenraad & M Kemerink (eds), Scanning Tunneling Microscopy/Spectroscopy and Related Techniques: 12th International Conference STM'03. AIP Conference Proceedings, vol. 696, American Institute of Physics, New York, NY, pp. 271-279, 12th International Conference on Scanning Tunneling Microscopy, STM 2003, Eindhoven, Netherlands, 20/07/03. https://doi.org/10.1063/1.1639706

Scanning Probe Microscopy Markup Language. / Bolhuis, T.; Pasop, J.; Abelmann, L. et al.

Scanning Tunneling Microscopy/Spectroscopy and Related Techniques: 12th International Conference STM'03. ed. / Paul M. Koenraad; Martijn Kemerink. New York, NY : American Institute of Physics, 2003. p. 271-279 (AIP Conference Proceedings; Vol. 696).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Scanning Probe Microscopy Markup Language

AU - Bolhuis, T.

AU - Pasop, J.

AU - Abelmann, L.

AU - Lodder, J.C.

N1 - Conference code: 12

PY - 2003/7/20

Y1 - 2003/7/20

N2 - The numerous, proprietary file formats for Scanning Probe Microscopy (SPM) have caused problems in the field of both off‐line quantitative, data analysis and comparison, as well as long‐term archiving of measurement results. Because of the eminent roll SPM’s are playing in the multidisciplinary scientific world of today, an open, XML‐based, standard SPM data format, called Scanning Probe Microscopy Markup Language (SPML) is proposed. XML (eXtensible Markup Language) has proven to be well applicable for standardized, structured, scientific data formats in many other disciplines. The structure of SPML will be explained briefly. The versatility of SPML as well as the possibilities of documenting, publishing, searching and exchanging SPM‐data will be shown in examples. This paper gives an overview of the proposed data format, while the complete description can be found at http://spml.net.

AB - The numerous, proprietary file formats for Scanning Probe Microscopy (SPM) have caused problems in the field of both off‐line quantitative, data analysis and comparison, as well as long‐term archiving of measurement results. Because of the eminent roll SPM’s are playing in the multidisciplinary scientific world of today, an open, XML‐based, standard SPM data format, called Scanning Probe Microscopy Markup Language (SPML) is proposed. XML (eXtensible Markup Language) has proven to be well applicable for standardized, structured, scientific data formats in many other disciplines. The structure of SPML will be explained briefly. The versatility of SPML as well as the possibilities of documenting, publishing, searching and exchanging SPM‐data will be shown in examples. This paper gives an overview of the proposed data format, while the complete description can be found at http://spml.net.

U2 - 10.1063/1.1639706

DO - 10.1063/1.1639706

M3 - Conference contribution

SN - 0-7354-0168-3

T3 - AIP Conference Proceedings

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BT - Scanning Tunneling Microscopy/Spectroscopy and Related Techniques

A2 - Koenraad, Paul M.

A2 - Kemerink, Martijn

PB - American Institute of Physics

CY - New York, NY

T2 - 12th International Conference on Scanning Tunneling Microscopy, STM 2003

Y2 - 20 July 2003 through 25 July 2003

ER -

Scanning Probe Microscopy Markup Language

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