Scatterer identification and analysis using combined InSAR and laser data

Ramon F. Hanssen, Adriaan van Natijne, Roderik C. Lindenbergh, Prabu Dheenathayalan, Mengshi Yang, Ling Chang, Freek van Leijen, Paco Lopez-Dekker, Jipper van der Maaden, Peter van Oosterom, Hanjiang Xiong, Pingbo Hu, Zhang Zhang, Bisheng Yang

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Engineering & Materials Science