Second-harmonic generation in stoichiometric silicon nitride glass waveguides

M.A. Garcia Porcel, J.P. Epping, M. Hoekman, P.J.M. van der Slot, Klaus J. Boller

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

Integrated optical waveguides based on stoichiometric silicon nitride (SÌ3N4) grown with low pressure chemical vapor deposition (LPCVD) are of high importance for applications, e.g., in microwave photonics [1] and quantum optics [2] due to their record-low loss and broad spectral transparency range. The material's third-order nonlinearity and wide transparency have enabled efficient nonlinear conversion, specifically, supercontinuum generation with record-wide bandwidth [3, 4] and are promising for all-optical switching [5].
Original languageEnglish
Title of host publication Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC, 2017 Conference on)
Place of PublicationMunich, Germany
PublisherIEEE
ISBN (Electronic)978-1-5090-6736-7
ISBN (Print)978-1-5090-6737-4
DOIs
Publication statusPublished - 30 Oct 2017
EventEuropean Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference 2017 - ICM Centre of the New Munich Trade Fair Centre, Munich, Germany
Duration: 25 Jun 201729 Jun 2017

Conference

ConferenceEuropean Conference on Lasers and Electro-Optics and the European Quantum Electronics Conference 2017
Abbreviated titleCLEO/Europe-EQEC 2017
CountryGermany
CityMunich
Period25/06/1729/06/17

Fingerprint Dive into the research topics of 'Second-harmonic generation in stoichiometric silicon nitride glass waveguides'. Together they form a unique fingerprint.

  • Cite this

    Garcia Porcel, M. A., Epping, J. P., Hoekman, M., van der Slot, P. J. M., & Boller, K. J. (2017). Second-harmonic generation in stoichiometric silicon nitride glass waveguides. In Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC, 2017 Conference on) Munich, Germany: IEEE. https://doi.org/10.1109/CLEOE-EQEC.2017.8086522