Abstract
Nickel thin films have been electrodeposited without the use of an additional seed layer, on highly doped silicon wafers. These substrates conduct sufficiently well to allow deposition using a peripherical electrical contact on
the wafer. Films 2 μm thick have been deposited using a nickel sulfamate bath on both n+- and p+-type silicon wafers, where a series of trenches with
different widths had been previously etched by plasma etching. A new, reliable and simple procedure based on the removal of the native oxide layer is presented which allows uniform plating of patterned substrates.
| Original language | English |
|---|---|
| Pages (from-to) | 1-6 |
| Number of pages | 6 |
| Journal | Journal of micromechanics and microengineering |
| Volume | 16 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 20 Jan 2006 |
Keywords
- 22/4 OA procedure
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