Self-test of a 256*4 bit stand-alone static RAM

R.H.A. Rijk, R.W.C. Dekker, H.G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationETC91
    Subtitle of host publication2nd European Test Conference, Munich, April 10-12, 1991: proceedings
    Place of PublicationBerlin
    PublisherVDE Verlag
    Pages11-16
    ISBN (Print)9783800717781
    Publication statusPublished - 1 Apr 1991

    Keywords

    • METIS-112969

    Cite this

    Rijk, R. H. A., Dekker, R. W. C., & Kerkhoff, H. G. (1991). Self-test of a 256*4 bit stand-alone static RAM. In ETC91: 2nd European Test Conference, Munich, April 10-12, 1991: proceedings (pp. 11-16). Berlin: VDE Verlag.
    Rijk, R.H.A. ; Dekker, R.W.C. ; Kerkhoff, H.G. / Self-test of a 256*4 bit stand-alone static RAM. ETC91: 2nd European Test Conference, Munich, April 10-12, 1991: proceedings. Berlin : VDE Verlag, 1991. pp. 11-16
    @inproceedings{70ef9745a358404a9085b0fb15caf5d8,
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    author = "R.H.A. Rijk and R.W.C. Dekker and H.G. Kerkhoff",
    year = "1991",
    month = "4",
    day = "1",
    language = "English",
    isbn = "9783800717781",
    pages = "11--16",
    booktitle = "ETC91",
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    Rijk, RHA, Dekker, RWC & Kerkhoff, HG 1991, Self-test of a 256*4 bit stand-alone static RAM. in ETC91: 2nd European Test Conference, Munich, April 10-12, 1991: proceedings. VDE Verlag, Berlin, pp. 11-16.

    Self-test of a 256*4 bit stand-alone static RAM. / Rijk, R.H.A.; Dekker, R.W.C.; Kerkhoff, H.G.

    ETC91: 2nd European Test Conference, Munich, April 10-12, 1991: proceedings. Berlin : VDE Verlag, 1991. p. 11-16.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    TY - GEN

    T1 - Self-test of a 256*4 bit stand-alone static RAM

    AU - Rijk, R.H.A.

    AU - Dekker, R.W.C.

    AU - Kerkhoff, H.G.

    PY - 1991/4/1

    Y1 - 1991/4/1

    KW - METIS-112969

    M3 - Conference contribution

    SN - 9783800717781

    SP - 11

    EP - 16

    BT - ETC91

    PB - VDE Verlag

    CY - Berlin

    ER -

    Rijk RHA, Dekker RWC, Kerkhoff HG. Self-test of a 256*4 bit stand-alone static RAM. In ETC91: 2nd European Test Conference, Munich, April 10-12, 1991: proceedings. Berlin: VDE Verlag. 1991. p. 11-16