Self-test of a 256*4 bit stand-alone static RAM

R.H.A. Rijk, R.W.C. Dekker, H.G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	ETC91
Subtitle of host publication	2nd European Test Conference, Munich, April 10-12, 1991: proceedings
Place of Publication	Berlin
Publisher	VDE Verlag
Pages	11-16
ISBN (Print)	9783800717781
Publication status	Published - 1 Apr 1991

Keywords

@inproceedings{70ef9745a358404a9085b0fb15caf5d8,

title = "Self-test of a 256*4 bit stand-alone static RAM",

keywords = "METIS-112969",

author = "R.H.A. Rijk and R.W.C. Dekker and H.G. Kerkhoff",

year = "1991",

month = apr,

day = "1",

language = "English",

isbn = "9783800717781",

pages = "11--16",

booktitle = "ETC91",

publisher = "VDE Verlag",

address = "Germany",

}