Self-test of a 256*4 bit stand-alone static RAM

R.H.A. Rijk, R.W.C. Dekker, H.G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationETC91
    Subtitle of host publication2nd European Test Conference, Munich, April 10-12, 1991: proceedings
    Place of PublicationBerlin
    PublisherVDE Verlag
    Pages11-16
    ISBN (Print)9783800717781
    Publication statusPublished - 1 Apr 1991

    Keywords

    • METIS-112969

    Cite this

    Rijk, R. H. A., Dekker, R. W. C., & Kerkhoff, H. G. (1991). Self-test of a 256*4 bit stand-alone static RAM. In ETC91: 2nd European Test Conference, Munich, April 10-12, 1991: proceedings (pp. 11-16). Berlin: VDE Verlag.