Self-test of a 256*4 bit stand-alone static RAM

R.H.A. Rijk, R.W.C. Dekker, H.G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationETC91
    Subtitle of host publication2nd European Test Conference, Munich, April 10-12, 1991: proceedings
    Place of PublicationBerlin
    PublisherVDE Verlag
    ISBN (Print)9783800717781
    Publication statusPublished - 1 Apr 1991


    • METIS-112969

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