Abstract
A sensitive measurement method is used to discern between the thermal effects of very small changes in device surroundings and to extract high thermal resistance values. The description of electro-thermal behavior is complemented by nematic liquid crystal imaging and FEM simulations of the heat spreading around the device.
Original language | English |
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Title of host publication | Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002 |
Pages | 77-82 |
Number of pages | 6 |
DOIs | |
Publication status | Published - 1 Dec 2002 |
Externally published | Yes |
Event | 2002 International Conference on Microelectronic Test Structures - Cork, Ireland Duration: 8 Apr 2002 → 11 Apr 2002 |
Conference
Conference | 2002 International Conference on Microelectronic Test Structures |
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Abbreviated title | ICMTS 2002 |
Country/Territory | Ireland |
City | Cork |
Period | 8/04/02 → 11/04/02 |