Sensitivity Analysis Based Tolerance-Box Generation and Propagation in Mixed-Signal SoC Testing

L. Fang, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    6 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings 7th IEEE European Test Workshop
    Place of PublicationCorfu, Greece
    Number of pages6
    Publication statusPublished - 26 May 2002


    • METIS-207850

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