Sensitivity Analysis Based Tolerance-Box Generation and Propagation in Mixed-Signal SoC Testing

L. Fang, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings 7th IEEE European Test Workshop
Place of Publication	Corfu, Greece
Pages	255-260
Number of pages	6
Publication status	Published - 26 May 2002

Keywords

@inproceedings{b6a06f06185d4e4995bfc44fb7721a01,

title = "Sensitivity Analysis Based Tolerance-Box Generation and Propagation in Mixed-Signal SoC Testing",

keywords = "METIS-207850",

author = "L. Fang and Kerkhoff, \{Hans G.\}",

year = "2002",

month = may,

day = "26",

language = "Undefined",

isbn = "geen",

pages = "255--260",

booktitle = "Proceedings 7th IEEE European Test Workshop",

}