Sensitivity of Interferometric Cross-Polarization Microscopy for Nanoparticle Detection in the Near-Infrared

B.T. Miles, E.C. Robinson, E.M.H.P. van Dijk, I.D. Lindsay, N.F. van Hulst, H. Gersen

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)

Abstract

We address the sensitivity of Interferometric Cross-Polarization Microscopy by comparing scattering and absorption by spherical 10 nm nanoparticles through a combination of modeling and experiment. We show that orthogonality of light in the two polarization branches of Cross-Polarization Microscopy ensures that only light that has interacted with a nanoparticle is interferometrically enhanced. As a result background-free shot noise-limited detection is achieved for sub-μW optical powers at the sample. Our modeling in particular shows that in the near-infrared regime, above the plasmon resonance frequency of spherical nanoparticles, the cross-polarization approach is several orders of magnitude more sensitive than conventional extinction based detection. This enhanced near-infrared sensitivity for spherical nanoparticles is promising for applications requiring low absorption and low power imaging of nanoparticles in cells
Original languageEnglish
Pages (from-to)1705-1711
JournalACS photonics
Volume2
Issue number12
DOIs
Publication statusPublished - 3 Nov 2015

Keywords

  • IR-99816
  • METIS-313090

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    Miles, B. T., Robinson, E. C., van Dijk, E. M. H. P., Lindsay, I. D., van Hulst, N. F., & Gersen, H. (2015). Sensitivity of Interferometric Cross-Polarization Microscopy for Nanoparticle Detection in the Near-Infrared. ACS photonics, 2(12), 1705-1711. https://doi.org/10.1021/acsphotonics.5b00326