Sensitivity of Interferometric Cross-Polarization Microscopy for Nanoparticle Detection in the Near-Infrared

B.T. Miles, E.C. Robinson, E.M.H.P. van Dijk, I.D. Lindsay, N.F. van Hulst, H. Gersen

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

Abstract

We address the sensitivity of Interferometric Cross-Polarization Microscopy by comparing scattering and absorption by spherical 10 nm nanoparticles through a combination of modeling and experiment. We show that orthogonality of light in the two polarization branches of Cross-Polarization Microscopy ensures that only light that has interacted with a nanoparticle is interferometrically enhanced. As a result background-free shot noise-limited detection is achieved for sub-μW optical powers at the sample. Our modeling in particular shows that in the near-infrared regime, above the plasmon resonance frequency of spherical nanoparticles, the cross-polarization approach is several orders of magnitude more sensitive than conventional extinction based detection. This enhanced near-infrared sensitivity for spherical nanoparticles is promising for applications requiring low absorption and low power imaging of nanoparticles in cells
Original languageEnglish
Pages (from-to)1705-1711
JournalACS photonics
Volume2
Issue number12
DOIs
Publication statusPublished - 3 Nov 2015

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Polarization Microscopy
cross polarization
Nanoparticles
Microscopic examination
Polarization
microscopy
Infrared radiation
nanoparticles
Light
Light extinction
Shot noise
orthogonality
shot noise
extinction
Scattering
Imaging techniques
sensitivity
polarization
cells
scattering

Keywords

  • IR-99816
  • METIS-313090

Cite this

Miles, B. T., Robinson, E. C., van Dijk, E. M. H. P., Lindsay, I. D., van Hulst, N. F., & Gersen, H. (2015). Sensitivity of Interferometric Cross-Polarization Microscopy for Nanoparticle Detection in the Near-Infrared. ACS photonics, 2(12), 1705-1711. https://doi.org/10.1021/acsphotonics.5b00326
Miles, B.T. ; Robinson, E.C. ; van Dijk, E.M.H.P. ; Lindsay, I.D. ; van Hulst, N.F. ; Gersen, H. / Sensitivity of Interferometric Cross-Polarization Microscopy for Nanoparticle Detection in the Near-Infrared. In: ACS photonics. 2015 ; Vol. 2, No. 12. pp. 1705-1711.
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Miles, BT, Robinson, EC, van Dijk, EMHP, Lindsay, ID, van Hulst, NF & Gersen, H 2015, 'Sensitivity of Interferometric Cross-Polarization Microscopy for Nanoparticle Detection in the Near-Infrared', ACS photonics, vol. 2, no. 12, pp. 1705-1711. https://doi.org/10.1021/acsphotonics.5b00326

Sensitivity of Interferometric Cross-Polarization Microscopy for Nanoparticle Detection in the Near-Infrared. / Miles, B.T.; Robinson, E.C.; van Dijk, E.M.H.P.; Lindsay, I.D.; van Hulst, N.F.; Gersen, H.

In: ACS photonics, Vol. 2, No. 12, 03.11.2015, p. 1705-1711.

Research output: Contribution to journalArticleAcademicpeer-review

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AU - Miles, B.T.

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AU - Lindsay, I.D.

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AU - Gersen, H.

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