@inproceedings{c1353a5d92b744d48976da1a3ccb603d,
title = "Separation of intrinsic dielectric and resistive electrode losses in ferroelectric capacitors at radio frequencies",
abstract = "To analyze the intrinsic dielectric performance of planar high-density capacitors at radio frequencies (RF), the dielectric losses need to be distinguished from the resistive electrode losses. The resistive losses of the electrodes at RF are de-embedded employing a linear regression procedure with partial compensation for distributed effects. We use tunable ferroelectric capacitors with a barium strontium titanate (BST) dielectric with an inner diameter d ≥ 8 μm on a silicon substrate. The de-embedding of the electrode losses has been successfully performed utilizing 1-Port RF measurement data from of an Advantest R3767CG vector network analyzer (VNA) in the frequency range of 10 MHz – 8 GHz.",
keywords = "SC-ICF: Integrated Circuit Fabrication, METIS-245936, IR-62113, EWI-11721",
author = "M.P.J. Tiggelman and K. Reimann and M. Klee and Jurriaan Schmitz and Hueting, {Raymond Josephus Engelbart} and J. Liu and Y. Furukawa and R. Mauczok and W. Keur",
year = "2007",
month = nov,
day = "29",
language = "Undefined",
isbn = "978-90-73461-49-9",
publisher = "STW",
number = "7",
pages = "465--467",
booktitle = "10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE)",
note = "null ; Conference date: 29-11-2007 Through 30-11-2007",
}