Shape characterization of magneto-optically written bits using parametric Fourier descriptors

P.J.A. van Schendel, S. Porthun, D.M. Donnet, J.C. Lodder

    Research output: Contribution to journalArticleAcademicpeer-review

    3 Downloads (Pure)

    Abstract

    In this paper, an approach to characterizing the shape of recorded bits is presented. This approach uses parametric Fourier descriptors (FDs). Some of the properties of FDs are discussed, and it is shown how FDs can be used to formulate a useful measure for shape irregularity, which is related to Signal to Noise ratio. Finally, it is shown that such a measure can be applied to characterize the shape of magneto-optically written bits, measured using MFM.
    Original languageEnglish
    Pages (from-to)373-376
    Number of pages4
    JournalJournal of the Magnetics Society of Japan
    Volume20
    Issue numberSuppl. 1
    DOIs
    Publication statusPublished - 1996
    Event4th Magneto-Optical Recording International Symposium, MORIS 1996 - Leeuwenhorst Conference Centre, Noordwijkerhout, Netherlands
    Duration: 29 Apr 19962 May 1996
    Conference number: 4

    Fingerprint

    magnetic force microscopy
    irregularities
    signal to noise ratios

    Keywords

    • SMI-REC: RECORDING
    • SMI-TST: From 2006 in EWI-TST

    Cite this

    van Schendel, P.J.A. ; Porthun, S. ; Donnet, D.M. ; Lodder, J.C. / Shape characterization of magneto-optically written bits using parametric Fourier descriptors. In: Journal of the Magnetics Society of Japan. 1996 ; Vol. 20, No. Suppl. 1. pp. 373-376.
    @article{9690cfd951164a6fbc86919c180a7085,
    title = "Shape characterization of magneto-optically written bits using parametric Fourier descriptors",
    abstract = "In this paper, an approach to characterizing the shape of recorded bits is presented. This approach uses parametric Fourier descriptors (FDs). Some of the properties of FDs are discussed, and it is shown how FDs can be used to formulate a useful measure for shape irregularity, which is related to Signal to Noise ratio. Finally, it is shown that such a measure can be applied to characterize the shape of magneto-optically written bits, measured using MFM.",
    keywords = "SMI-REC: RECORDING, SMI-TST: From 2006 in EWI-TST",
    author = "{van Schendel}, P.J.A. and S. Porthun and D.M. Donnet and J.C. Lodder",
    year = "1996",
    doi = "10.3379/jmsjmag.20.S1_373",
    language = "English",
    volume = "20",
    pages = "373--376",
    journal = "Journal of the Magnetics Society of Japan",
    issn = "0285-0192",
    publisher = "Magnetics Society of Japan",
    number = "Suppl. 1",

    }

    Shape characterization of magneto-optically written bits using parametric Fourier descriptors. / van Schendel, P.J.A.; Porthun, S.; Donnet, D.M.; Lodder, J.C.

    In: Journal of the Magnetics Society of Japan, Vol. 20, No. Suppl. 1, 1996, p. 373-376.

    Research output: Contribution to journalArticleAcademicpeer-review

    TY - JOUR

    T1 - Shape characterization of magneto-optically written bits using parametric Fourier descriptors

    AU - van Schendel, P.J.A.

    AU - Porthun, S.

    AU - Donnet, D.M.

    AU - Lodder, J.C.

    PY - 1996

    Y1 - 1996

    N2 - In this paper, an approach to characterizing the shape of recorded bits is presented. This approach uses parametric Fourier descriptors (FDs). Some of the properties of FDs are discussed, and it is shown how FDs can be used to formulate a useful measure for shape irregularity, which is related to Signal to Noise ratio. Finally, it is shown that such a measure can be applied to characterize the shape of magneto-optically written bits, measured using MFM.

    AB - In this paper, an approach to characterizing the shape of recorded bits is presented. This approach uses parametric Fourier descriptors (FDs). Some of the properties of FDs are discussed, and it is shown how FDs can be used to formulate a useful measure for shape irregularity, which is related to Signal to Noise ratio. Finally, it is shown that such a measure can be applied to characterize the shape of magneto-optically written bits, measured using MFM.

    KW - SMI-REC: RECORDING

    KW - SMI-TST: From 2006 in EWI-TST

    U2 - 10.3379/jmsjmag.20.S1_373

    DO - 10.3379/jmsjmag.20.S1_373

    M3 - Article

    VL - 20

    SP - 373

    EP - 376

    JO - Journal of the Magnetics Society of Japan

    JF - Journal of the Magnetics Society of Japan

    SN - 0285-0192

    IS - Suppl. 1

    ER -