Abstract
In this paper, an approach to characterizing the shape of recorded bits is presented. This approach uses parametric Fourier descriptors (FDs). Some of the properties of FDs are discussed, and it is shown how FDs can be used to formulate a useful measure for shape irregularity, which is related to Signal to Noise ratio. Finally, it is shown that such a measure can be applied to characterize the shape of magneto-optically written bits, measured using MFM.
Original language | English |
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Pages (from-to) | 373-376 |
Number of pages | 4 |
Journal | Journal of the Magnetics Society of Japan |
Volume | 20 |
Issue number | Suppl. 1 |
DOIs | |
Publication status | Published - 1996 |
Event | 4th Magneto-Optical Recording International Symposium, MORIS 1996 - Leeuwenhorst Conference Centre, Noordwijkerhout, Netherlands Duration: 29 Apr 1996 → 2 May 1996 Conference number: 4 |
Keywords
- SMI-REC: RECORDING
- SMI-TST: From 2006 in EWI-TST