Shape characterization of magneto-optically written bits using parametric Fourier descriptors

P.J.A. van Schendel, S. Porthun, D.M. Donnet, J.C. Lodder

    Research output: Contribution to journalArticleAcademicpeer-review

    11 Downloads (Pure)

    Abstract

    In this paper, an approach to characterizing the shape of recorded bits is presented. This approach uses parametric Fourier descriptors (FDs). Some of the properties of FDs are discussed, and it is shown how FDs can be used to formulate a useful measure for shape irregularity, which is related to Signal to Noise ratio. Finally, it is shown that such a measure can be applied to characterize the shape of magneto-optically written bits, measured using MFM.
    Original languageEnglish
    Pages (from-to)373-376
    Number of pages4
    JournalJournal of the Magnetics Society of Japan
    Volume20
    Issue numberSuppl. 1
    DOIs
    Publication statusPublished - 1996
    Event4th Magneto-Optical Recording International Symposium, MORIS 1996 - Leeuwenhorst Conference Centre, Noordwijkerhout, Netherlands
    Duration: 29 Apr 19962 May 1996
    Conference number: 4

    Keywords

    • SMI-REC: RECORDING
    • SMI-TST: From 2006 in EWI-TST

    Fingerprint Dive into the research topics of 'Shape characterization of magneto-optically written bits using parametric Fourier descriptors'. Together they form a unique fingerprint.

  • Cite this