Silicon optics for wide field X-ray imaging

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Abstract

Silicon pore optics (SPO)1 were originally designed to provide very large collecting areas combined with good angular resolution in narrow field X-ray telescopes. We describe modifications to the geometry and manufacture of SPO to facilitate wide field X-ray imaging applications. Modest changes can greatly improve the vignetting function and off-axis angular resolution of SPO in the Wolter I geometry. Reconfiguring SPO to form Kirkpatrick- Baez stacks in the Schmidt geometry can provide very large fields of view with high angular resolution and large collecting area.
Original languageEnglish
Title of host publicationOptics for EUV, X-Ray, and Gamma-Ray Astronomy VI
EditorsStephen L. O'Dell, Giovanni Pareschi
Place of PublicationBellingham, Washington
PublisherSPIE
Number of pages9
ISBN (Print)9780819497116
DOIs
Publication statusPublished - 26 Sept 2013
Externally publishedYes

Publication series

NameProceedings of the SPIE
PublisherThe International Society for Optical Engineering
Volume8861
ISSN (Print)0277-786X

Keywords

  • NLA

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