Abstract
Silicon oxynitride, a dielectric material with excellent optical properties, is applied for a wide range of integrated
optical devices operating at visible or NIR wavelengths. High-quality channel waveguides are reliably fabricated
by plasma enhanced chemical vapor deposition and reactive ion etching following standard lithography. Based
on a general, polarization-independent channel waveguide layout various arrayed waveguide gratings were
designed, realized and tested for on-chip spectrometers in Raman detection and optical coherence tomography
(OCT). With this approach Raman spectra of silicon and cyclohexane test samples are measured. An OCT image
of a phantom sample is produced.
| Original language | Undefined |
|---|---|
| Title of host publication | 13th International Conference on Transparent Optical Networks |
| Publisher | IEEE |
| Pages | 1-4 |
| Number of pages | 4 |
| ISBN (Print) | 978-1-4577-0882-4 |
| DOIs | |
| Publication status | Published - 26 Jun 2011 |
| Event | 13th International Conference on Transparent Optical Networks, ICTON 2011 - Stockholm, Sweden Duration: 26 Jun 2011 → 30 Jun 2011 Conference number: 13 |
Publication series
| Name | |
|---|---|
| Publisher | IEEE |
Conference
| Conference | 13th International Conference on Transparent Optical Networks, ICTON 2011 |
|---|---|
| Abbreviated title | ICTON |
| Country/Territory | Sweden |
| City | Stockholm |
| Period | 26/06/11 → 30/06/11 |
Keywords
- METIS-281557
- Integrated Optics
- Arrayed waveguide grating
- IR-78638
- EWI-20786
- PECVD
- Raman detection
- Silicon oxynitride
- IOMS-PIT: PHOTONICS INTEGRATION TECHNOLOGY
- Optical Coherence Tomography