Abstract
This paper describes a new method for the analysis and optimization of reliability as an integrated part of the design process of electronic circuits. It bases itself on the analysis of the susceptibility of failure mechanisms in components as a function of the combinations of external stress factors (stressor-sets). The paper describes the backgrounds of stressor-susceptibility analysis, the need for this analysis and the way this method is used for high-level design and optimization of electronic circuits.
| Original language | English |
|---|---|
| Pages (from-to) | 239-249 |
| Journal | Quality and reliability engineering international |
| Volume | 9 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1993 |
Keywords
- Design optimization
- Component failure mechanisms
- Stressor-susceptibility analysis
- High-volume consumer electronics