Simulation, a tool for designing-in reliability

Aarnout Brombacher, Erik van Geest, Robert Arendsen, Anne van Steenwijk, Otto Herrmann

    Research output: Contribution to journalArticleAcademic

    1 Citation (Scopus)

    Abstract

    This paper describes a new method for the analysis and optimization of reliability as an integrated part of the design process of electronic circuits. It bases itself on the analysis of the susceptibility of failure mechanisms in components as a function of the combinations of external stress factors (stressor-sets). The paper describes the backgrounds of stressor-susceptibility analysis, the need for this analysis and the way this method is used for high-level design and optimization of electronic circuits.
    Original languageEnglish
    Pages (from-to)239-249
    JournalQuality and reliability engineering international
    Volume9
    Issue number4
    DOIs
    Publication statusPublished - 1993

    Keywords

    • Design optimization
    • Component failure mechanisms
    • Stressor-susceptibility analysis
    • High-volume consumer electronics

    Fingerprint Dive into the research topics of 'Simulation, a tool for designing-in reliability'. Together they form a unique fingerprint.

    Cite this