Simulation, a tool for designing in reliability

A.C. Brombacher; D.C.L. van Geest; R.G.J. Arendsen; A. van Steenwijk; O.E. Herrmann

Simulation, a tool for designing in reliability

A.C. Brombacher
, D.C.L. van Geest
, R.G.J. Arendsen
, A. van Steenwijk
, O.E. Herrmann

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Conference proceedings / ESREF 92
Editors	Wolfgang H. Gerling
Place of Publication	Berlin, Offenbach
Publisher	VDE Verlag
Pages	201-210
Number of pages	10
ISBN (Print)	3-8007-1886-3
Publication status	Published - 1 Sept 1992
Event	3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 1992 - Schwabisch-Gmund, Germany Duration: 5 Oct 1992 → 8 Oct 1992 Conference number: 3

Conference

Conference	3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 1992
Abbreviated title	ESREF
Country/Territory	Germany
City	Schwabisch-Gmund
Period	5/10/92 → 8/10/92

Cite this

@inproceedings{7abd01ad341b472c9ef4d999ceb5c010,

title = "Simulation, a tool for designing in reliability",

author = "A.C. Brombacher and \{van Geest\}, D.C.L. and R.G.J. Arendsen and \{van Steenwijk\}, A. and O.E. Herrmann",

year = "1992",

month = sep,

day = "1",

language = "English",

isbn = "3-8007-1886-3",

pages = "201--210",

editor = "Gerling, \{Wolfgang H.\}",

booktitle = "Conference proceedings / ESREF 92",

publisher = "VDE Verlag",

address = "Germany",

note = "3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 1992, ESREF ; Conference date: 05-10-1992 Through 08-10-1992",

}

Brombacher, AC, van Geest, DCL, Arendsen, RGJ, van Steenwijk, A & Herrmann, OE 1992, Simulation, a tool for designing in reliability. in WH Gerling (ed.), Conference proceedings / ESREF 92. VDE Verlag, Berlin, Offenbach, pp. 201-210, 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 1992, Schwabisch-Gmund, Baden-Württemberg, Germany, 5/10/92.

TY - GEN

T1 - Simulation, a tool for designing in reliability

AU - Brombacher, A.C.

AU - van Geest, D.C.L.

AU - Arendsen, R.G.J.

AU - van Steenwijk, A.

AU - Herrmann, O.E.

N1 - Conference code: 3

PY - 1992/9/1

Y1 - 1992/9/1

M3 - Conference contribution

SN - 3-8007-1886-3

SP - 201

EP - 210

BT - Conference proceedings / ESREF 92

A2 - Gerling, Wolfgang H.

PB - VDE Verlag

CY - Berlin, Offenbach

T2 - 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 1992

Y2 - 5 October 1992 through 8 October 1992

ER -