Simulation and measurement of N-channel MOSFET RTS noise under switched bias conditions

A.P. van der Wel, Eric A.M. Klumperink, Bram Nauta

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the 12th ProRISC workshop (program for Research on Integrated Systems and Circuits)
    Place of PublicationUtrecht
    PublisherSTW
    Pages734-737
    Number of pages4
    ISBN (Print)90-73461-29-4
    Publication statusPublished - 28 Nov 2001
    Event14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003 - Veldhoven, Netherlands
    Duration: 25 Nov 200327 Nov 2003
    Conference number: 14

    Publication series

    Name
    PublisherSTW, Technology Foundations

    Workshop

    Workshop14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003
    Abbreviated titleProRISC
    CountryNetherlands
    CityVeldhoven
    Period25/11/0327/11/03

    Keywords

    • IR-42571
    • METIS-201947

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