Simulation and measurement of N-channel MOSFET RTS noise under switched bias conditions

A.P. van der Wel; Eric A.M. Klumperink; Bram Nauta

Simulation and measurement of N-channel MOSFET RTS noise under switched bias conditions

A.P. van der Wel, Eric A.M. Klumperink, Bram Nauta

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of the 12th ProRISC workshop (program for Research on Integrated Systems and Circuits)
Place of Publication	Utrecht
Publisher	STW
Pages	734-737
Number of pages	4
ISBN (Print)	90-73461-29-4
Publication status	Published - 28 Nov 2001
Event	14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003 - Veldhoven, Netherlands Duration: 25 Nov 2003 → 27 Nov 2003 Conference number: 14

Publication series

Name
Publisher	STW, Technology Foundations

Workshop

Workshop	14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003
Abbreviated title	ProRISC
Country/Territory	Netherlands
City	Veldhoven
Period	25/11/03 → 27/11/03

Keywords

IR-42571
METIS-201947

Cite this

@inproceedings{7b70b2ab33de4d488bc47fa8458c7a40,

title = "Simulation and measurement of N-channel MOSFET RTS noise under switched bias conditions",

keywords = "IR-42571, METIS-201947",

author = "{van der Wel}, A.P. and Klumperink, {Eric A.M.} and Bram Nauta",

year = "2001",

month = nov,

day = "28",

language = "English",

isbn = "90-73461-29-4",

publisher = "STW",

pages = "734--737",

booktitle = "Proceedings of the 12th ProRISC workshop (program for Research on Integrated Systems and Circuits)",

note = "14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003, ProRISC ; Conference date: 25-11-2003 Through 27-11-2003",

}

van der Wel, AP, Klumperink, EAM & Nauta, B 2001, Simulation and measurement of N-channel MOSFET RTS noise under switched bias conditions. in Proceedings of the 12th ProRISC workshop (program for Research on Integrated Systems and Circuits). STW, Utrecht, pp. 734-737, 14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003, Veldhoven, Netherlands, 25/11/03.

Simulation and measurement of N-channel MOSFET RTS noise under switched bias conditions. / van der Wel, A.P.; Klumperink, Eric A.M.; Nauta, Bram.

Proceedings of the 12th ProRISC workshop (program for Research on Integrated Systems and Circuits). Utrecht : STW, 2001. p. 734-737.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Simulation and measurement of N-channel MOSFET RTS noise under switched bias conditions

AU - van der Wel, A.P.

AU - Klumperink, Eric A.M.

AU - Nauta, Bram

N1 - Conference code: 14

PY - 2001/11/28

Y1 - 2001/11/28

KW - IR-42571

KW - METIS-201947

M3 - Conference contribution

SN - 90-73461-29-4

SP - 734

EP - 737

BT - Proceedings of the 12th ProRISC workshop (program for Research on Integrated Systems and Circuits)

PB - STW

CY - Utrecht

T2 - 14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003

Y2 - 25 November 2003 through 27 November 2003

ER -