@inproceedings{7b70b2ab33de4d488bc47fa8458c7a40,
title = "Simulation and measurement of N-channel MOSFET RTS noise under switched bias conditions",
keywords = "IR-42571, METIS-201947",
author = "{van der Wel}, A.P. and Klumperink, {Eric A.M.} and Bram Nauta",
year = "2001",
month = nov,
day = "28",
language = "English",
isbn = "90-73461-29-4",
publisher = "STW",
pages = "734--737",
booktitle = "Proceedings of the 12th ProRISC workshop (program for Research on Integrated Systems and Circuits)",
note = "14th ProRISC Workshop on Circuits, Systems and Signal Processing 2003, ProRISC ; Conference date: 25-11-2003 Through 27-11-2003",
}