Simulation and Measurement of RTS noise in N-Channel MOSFETs under Switched Bias Conditions

A.P. van der Wel, Eric A.M. Klumperink, Bram Nauta, L.K.J. Vandamme, Sander L.J. Gierkink

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    Original languageUndefined
    Title of host publication16th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF 2001)
    EditorsGijs Bosman
    PublisherWorld Scientific
    Pages391-394
    Number of pages4
    ISBN (Print)9810246773
    Publication statusPublished - Oct 2001
    Event16th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 2001 - Gainesville, Florida
    Duration: 22 Oct 200125 Oct 2001

    Publication series

    Name
    PublisherWorld Scientific

    Conference

    Conference16th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 2001
    Period22/10/0125/10/01
    Other22-25 October 2001

    Keywords

    • EWI-14362
    • METIS-204135
    • IR-42857

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