Simulation and Measurement of RTS noise in N-Channel MOSFETs under Switched Bias Conditions

A.P. van der Wel; Eric A.M. Klumperink; Bram Nauta; L.K.J. Vandamme; Sander L.J. Gierkink

Simulation and Measurement of RTS noise in N-Channel MOSFETs under Switched Bias Conditions

A.P. van der Wel, Eric A.M. Klumperink, Bram Nauta, L.K.J. Vandamme, Sander L.J. Gierkink

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

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Original language	Undefined
Title of host publication	16th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF 2001)
Editors	Gijs Bosman
Publisher	World Scientific
Pages	391-394
Number of pages	4
ISBN (Print)	9810246773
Publication status	Published - Oct 2001
Event	16th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 2001 - Gainesville, Florida Duration: 22 Oct 2001 → 25 Oct 2001

Publication series

Name
Publisher	World Scientific

Conference

Conference	16th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 2001
Period	22/10/01 → 25/10/01
Other	22-25 October 2001

Keywords

EWI-14362
METIS-204135
IR-42857

Access to Document

http://eprints.eemcs.utwente.nl/secure2/14362/01/simulation.pdf

Cite this

van der Wel, A. P., Klumperink, E. A. M., Nauta, B., Vandamme, L. K. J., & Gierkink, S. L. J. (2001). Simulation and Measurement of RTS noise in N-Channel MOSFETs under Switched Bias Conditions. In G. Bosman (Ed.), 16th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF 2001) (pp. 391-394). World Scientific. http://eprints.eemcs.utwente.nl/secure2/14362/01/simulation.pdf

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title = "Simulation and Measurement of RTS noise in N-Channel MOSFETs under Switched Bias Conditions",

keywords = "EWI-14362, METIS-204135, IR-42857",

author = "{van der Wel}, A.P. and Klumperink, {Eric A.M.} and Bram Nauta and L.K.J. Vandamme and Gierkink, {Sander L.J.}",

year = "2001",

month = oct,

language = "Undefined",

isbn = "9810246773",

publisher = "World Scientific",

pages = "391--394",

editor = "Gijs Bosman",

booktitle = "16th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF 2001)",

address = "United States",

note = "16th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 2001 ; Conference date: 22-10-2001 Through 25-10-2001",

}

van der Wel, AP, Klumperink, EAM , Nauta, B, Vandamme, LKJ & Gierkink, SLJ 2001, Simulation and Measurement of RTS noise in N-Channel MOSFETs under Switched Bias Conditions. in G Bosman (ed.), 16th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF 2001). World Scientific, pp. 391-394, 16th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 2001, 22/10/01. <http://eprints.eemcs.utwente.nl/secure2/14362/01/simulation.pdf>

Simulation and Measurement of RTS noise in N-Channel MOSFETs under Switched Bias Conditions. / van der Wel, A.P.; Klumperink, Eric A.M.; Nauta, Bram et al.
16th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF 2001). ed. / Gijs Bosman. World Scientific, 2001. p. 391-394.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

TY - GEN

T1 - Simulation and Measurement of RTS noise in N-Channel MOSFETs under Switched Bias Conditions

AU - van der Wel, A.P.

AU - Klumperink, Eric A.M.

AU - Nauta, Bram

AU - Vandamme, L.K.J.

AU - Gierkink, Sander L.J.

PY - 2001/10

Y1 - 2001/10

KW - EWI-14362

KW - METIS-204135

KW - IR-42857

M3 - Conference contribution

SN - 9810246773

SP - 391

EP - 394

BT - 16th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF 2001)

A2 - Bosman, Gijs

PB - World Scientific

T2 - 16th International Conference on Noise in Physical Systems and 1/f Fluctuations, ICNF 2001

Y2 - 22 October 2001 through 25 October 2001

ER -