Simulation and Optimisation of Circuit-level Reliability for Long-term Failure Mechanisms

D.C.L. van Geest

    Research output: ThesisPhD Thesis - Research UT, graduation external

    Original languageUndefined
    Awarding Institution
    • University of Twente
    Supervisors/Advisors
    • Herrmann, O.E., Supervisor
    • Brombacher, A.C., Supervisor
    Award date11 Apr 1997
    Place of PublicationEnschede
    Publisher
    Print ISBNs90-9010456-9
    Publication statusPublished - 11 Apr 1997

    Keywords

    • METIS-111387

    Cite this

    van Geest, D. C. L. (1997). Simulation and Optimisation of Circuit-level Reliability for Long-term Failure Mechanisms. Enschede: Universiteit Twente, Laboratorium voor Netwerktheorie.