Simulation and Optimisation of Circuit-level Reliability for Long-term Failure Mechanisms

D.C.L. van Geest

Research output: Thesis › PhD Thesis - Research UT, graduation external

Original language	Undefined
Awarding Institution	University of Twente
Supervisors/Advisors	Herrmann, O.E., Supervisor Brombacher, A.C., Supervisor
Award date	11 Apr 1997
Place of Publication	Enschede
Publisher	Universiteit Twente, Laboratorium voor Netwerktheorie
Print ISBNs	90-9010456-9
Publication status	Published - 11 Apr 1997

Keywords

@phdthesis{443ec92df34b4b75adb22f9b8a2e22b0,

title = "Simulation and Optimisation of Circuit-level Reliability for Long-term Failure Mechanisms",

keywords = "METIS-111387",

author = "{van Geest}, D.C.L.",

year = "1997",

month = apr,

day = "11",

language = "Undefined",

isbn = "90-9010456-9",

publisher = "Universiteit Twente, Laboratorium voor Netwerktheorie",

type = "PhD Thesis - Research UT, graduation external",

school = "University of Twente",

}