Simulation and Optimisation of Circuit-level Reliability for Long-term Failure Mechanisms

D.C.L. van Geest

    Research output: ThesisPhD Thesis - Research UT, graduation externalAcademic

    Original languageUndefined
    Awarding Institution
    • University of Twente
    Supervisors/Advisors
    • Herrmann, O.E., Supervisor
    • Brombacher, A.C., Supervisor
    Award date11 Apr 1997
    Place of PublicationEnschede
    Publisher
    Print ISBNs90-9010456-9
    Publication statusPublished - 11 Apr 1997

    Keywords

    • METIS-111387

    Cite this

    van Geest, D. C. L. (1997). Simulation and Optimisation of Circuit-level Reliability for Long-term Failure Mechanisms. Enschede: Universiteit Twente, Laboratorium voor Netwerktheorie.
    van Geest, D.C.L.. / Simulation and Optimisation of Circuit-level Reliability for Long-term Failure Mechanisms. Enschede : Universiteit Twente, Laboratorium voor Netwerktheorie, 1997. 164 p.
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    title = "Simulation and Optimisation of Circuit-level Reliability for Long-term Failure Mechanisms",
    keywords = "METIS-111387",
    author = "{van Geest}, D.C.L.",
    year = "1997",
    month = "4",
    day = "11",
    language = "Undefined",
    isbn = "90-9010456-9",
    publisher = "Universiteit Twente, Laboratorium voor Netwerktheorie",
    school = "University of Twente",

    }

    Simulation and Optimisation of Circuit-level Reliability for Long-term Failure Mechanisms. / van Geest, D.C.L.

    Enschede : Universiteit Twente, Laboratorium voor Netwerktheorie, 1997. 164 p.

    Research output: ThesisPhD Thesis - Research UT, graduation externalAcademic

    TY - THES

    T1 - Simulation and Optimisation of Circuit-level Reliability for Long-term Failure Mechanisms

    AU - van Geest, D.C.L.

    PY - 1997/4/11

    Y1 - 1997/4/11

    KW - METIS-111387

    M3 - PhD Thesis - Research UT, graduation external

    SN - 90-9010456-9

    PB - Universiteit Twente, Laboratorium voor Netwerktheorie

    CY - Enschede

    ER -

    van Geest DCL. Simulation and Optimisation of Circuit-level Reliability for Long-term Failure Mechanisms. Enschede: Universiteit Twente, Laboratorium voor Netwerktheorie, 1997. 164 p.