Simulation of electromigration early resistance changes

J. Niehof, H.C. de Graaff, J.F. Verweij

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93
    Place of PublicationBordeaux, Arcachon, France
    Pages135-140
    Publication statusPublished - 4 Oct 1993

    Keywords

    • METIS-113993

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