Simulation of electromigration early resistance changes

J. Niehof; H.C. de Graaff; J.F. Verweij

Simulation of electromigration early resistance changes

J. Niehof, H.C. de Graaff, J.F. Verweij

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93
Place of Publication	Bordeaux, Arcachon, France
Pages	135-140
Publication status	Published - 4 Oct 1993

Keywords

METIS-113993

Cite this

@inproceedings{58a7cfaf10be43378af0e9f409dbe09c,

title = "Simulation of electromigration early resistance changes",

keywords = "METIS-113993",

author = "J. Niehof and \{de Graaff\}, H.C. and J.F. Verweij",

year = "1993",

month = oct,

day = "4",

language = "Undefined",

pages = "135--140",

booktitle = "Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93",

}

Simulation of electromigration early resistance changes. / Niehof, J.; de Graaff, H.C.; Verweij, J.F.
Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93. Bordeaux, Arcachon, France, 1993. p. 135-140.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Simulation of electromigration early resistance changes

AU - Niehof, J.

AU - de Graaff, H.C.

AU - Verweij, J.F.

PY - 1993/10/4

Y1 - 1993/10/4

KW - METIS-113993

M3 - Conference contribution

SP - 135

EP - 140

BT - Proceedings 6th International Conference Quality in Electronic Components Failure Prevention, Detection and Analysis, ESREF '93

CY - Bordeaux, Arcachon, France

ER -