Simulation of lay-out dependent electrical-thermal interaction in a bipolar transistor

M. Oosterbaan, A.J. Mouthaan, H. Boezen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the Eight International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits, NASECODE VIII Conference
    Place of PublicationWenen
    Pages142-146
    Number of pages0
    Publication statusPublished - 19 May 1992

    Keywords

    • METIS-112869

    Cite this

    Oosterbaan, M., Mouthaan, A. J., & Boezen, H. (1992). Simulation of lay-out dependent electrical-thermal interaction in a bipolar transistor. In Proceedings of the Eight International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits, NASECODE VIII Conference (pp. 142-146). Wenen.