Simulation of lay-out dependent electrical-thermal interaction in a bipolar transistor

M. Oosterbaan, A.J. Mouthaan, H. Boezen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the Eight International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits, NASECODE VIII Conference
    Place of PublicationWenen
    Number of pages0
    Publication statusPublished - 19 May 1992


    • METIS-112869

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