Simulation of thermal runaway during ESD events

R.A.M. Beltman, H. van der Vlist, A.J. Mouthaan

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationEOS/ESD Symposium
    Place of PublicationOrlando, USA
    Pages-
    Number of pages0
    Publication statusPublished - 11 Sept 1990

    Keywords

    • METIS-113946

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