Simulation of X-ray diffraction-line broadening for a material containing misfitting precipitates

Teunis Cornelis Bor, R Delhez, E.J. Mittemeijer, E. van der Giessen

Research output: Contribution to journalArticleAcademic

2 Citations (Scopus)

Abstract

The locally varying strain field in a matrix containing misfitting second phase particles and its effects on diffraction-line broadening have been simulated numerically. A two-dimensional model material has been considered: A matrix with a periodic arrangement of misfitting circular second phase particles. The strain field is calculated numerically from a micro mechanical model that in principle takes into account the elastic interaction of the misfitting particles. Diffraction-line profiles have been calculated as a function of particle fraction and particle/matrix misfit. Shifts and broadenings of these line profiles have been discussed with reference to known characteristics of Eshelby's approach for point imperfections.
Original languageUndefined
Pages (from-to)896-899
JournalMaterials science and engineering
Volume234-23
DOIs
Publication statusPublished - 1997

Keywords

  • Misfitting particles
  • Micromechanical modelling
  • X-ray diffraction-line broadening
  • IR-75611

Cite this