Simultaneous characterization of detector and source imperfections in infrared ellipsometry

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Keywords

@article{f87d47702fc1426ca074bc142d8e90e0,

title = "Simultaneous characterization of detector and source imperfections in infrared ellipsometry",

keywords = "METIS-257012",

author = "Herbert Wormeester and P.R. Kole and Bene Poelsema",

year = "2009",

language = "Undefined",

volume = "48",

pages = "2853--2859",

journal = "Applied Optics",

issn = "0003-6935",

publisher = "Optica Publishing Group (formerly OSA)",

number = "15",

}