Simultaneous extraction of threshold voltage and mobility degradation from on-the-fly NBTI measurements

Rudolf W. Herfst; Jurriaan  Schmitz; Andries J. Scholten

doi:10.1109/IRPS.2011.5784607

Simultaneous extraction of threshold voltage and mobility degradation from on-the-fly NBTI measurements

Rudolf W. Herfst, Jurriaan Schmitz, Andries J. Scholten

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

Abstract

Conventional on-the-fly characterization of NBTI translates measured changes in drain current to a threshold voltage shift only. In this paper, we show how to extend this method to the simultaneous determination of threshold voltage and zero-field-mobility degradation by. This is achieved by using a Vector Network Analyzer for OTF characterization of gds and gm. For the technology under study, we have found that degradation in the zero-field mobility is responsible for at most 10% of the drain current change. Effective mobility, on the other hand, does change as a direct consequence of the threshold-voltage shift.

Original language	English
Title of host publication	2011 IEEE International Reliability Physics Symposium, IRPS 2011
Subtitle of host publication	Monterey, California, USA, 10-14 April 2011
Publisher	IEEE Reliability Society
Pages	XT.6.1-6.4
Number of pages	4
ISBN (Print)	978-1-4244-9113-1
DOIs	https://doi.org/10.1109/IRPS.2011.5784607
Publication status	Published - 10 Apr 2011
Event	49th Annual IEEE International Reliability Physics Symposium, IRPS 2011 - Monterey, United States Duration: 10 Apr 2011 → 14 Apr 2011 Conference number: 49

Conference

Conference	49th Annual IEEE International Reliability Physics Symposium, IRPS 2011
Abbreviated title	IRPS
Country	United States
City	Monterey
Period	10/04/11 → 14/04/11

Keywords

METIS-277730
IR-77950
On The Fly
EWI-20213
RF
NBTI
Reliability

Access to Document

10.1109/IRPS.2011.5784607

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Herfst, R. W., Schmitz, J., & Scholten, A. J. (2011). Simultaneous extraction of threshold voltage and mobility degradation from on-the-fly NBTI measurements. In 2011 IEEE International Reliability Physics Symposium, IRPS 2011: Monterey, California, USA, 10-14 April 2011 (pp. XT.6.1-6.4). IEEE Reliability Society. https://doi.org/10.1109/IRPS.2011.5784607

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title = "Simultaneous extraction of threshold voltage and mobility degradation from on-the-fly NBTI measurements",

abstract = "Conventional on-the-fly characterization of NBTI translates measured changes in drain current to a threshold voltage shift only. In this paper, we show how to extend this method to the simultaneous determination of threshold voltage and zero-field-mobility degradation by. This is achieved by using a Vector Network Analyzer for OTF characterization of gds and gm. For the technology under study, we have found that degradation in the zero-field mobility is responsible for at most 10{\%} of the drain current change. Effective mobility, on the other hand, does change as a direct consequence of the threshold-voltage shift.",

keywords = "METIS-277730, IR-77950, On The Fly, EWI-20213, RF, NBTI, Reliability",

author = "Herfst, {Rudolf W.} and Jurriaan Schmitz and Scholten, {Andries J.}",

year = "2011",

month = "4",

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doi = "10.1109/IRPS.2011.5784607",

language = "English",

isbn = "978-1-4244-9113-1",

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booktitle = "2011 IEEE International Reliability Physics Symposium, IRPS 2011",

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Herfst, RW, Schmitz, J & Scholten, AJ 2011, Simultaneous extraction of threshold voltage and mobility degradation from on-the-fly NBTI measurements. in 2011 IEEE International Reliability Physics Symposium, IRPS 2011: Monterey, California, USA, 10-14 April 2011. IEEE Reliability Society, pp. XT.6.1-6.4, 49th Annual IEEE International Reliability Physics Symposium, IRPS 2011, Monterey, United States, 10/04/11. https://doi.org/10.1109/IRPS.2011.5784607

Simultaneous extraction of threshold voltage and mobility degradation from on-the-fly NBTI measurements. / Herfst, Rudolf W.; Schmitz, Jurriaan ; Scholten, Andries J.

2011 IEEE International Reliability Physics Symposium, IRPS 2011: Monterey, California, USA, 10-14 April 2011. IEEE Reliability Society, 2011. p. XT.6.1-6.4.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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