Simultaneous measurement of static and kinetic friction of ZnO nanowires in situ with a scanning electron microscope

Boris Polyakov*, Leonid M. Dorogin, Sergei Vlassov, Ilmar Kink, Alexey E. Romanov, Rynno Lohmus

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

13 Citations (Scopus)

Abstract

A novel method for in situ measurement of the static and kinetic friction is developed and demonstrated for zinc oxide nanowires (NWs) on oxidised silicon wafers. The experiments are performed inside a scanning electron microscope (SEM) equipped with a nanomanipulator with an atomic force microscope tip as a probe. NWs are pushed by the tip from one end until complete displacement is achieved, while NW bending is monitored by the SEM. The elastic bending profile of a NW during the manipulation process is used to calculate the static and kinetic friction forces.
Original languageEnglish
Pages (from-to)1140-1146
JournalMicron
Volume43
Issue number11
DOIs
Publication statusPublished - 2012
Externally publishedYes

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