Single-shot damage of Ru thin film induced by FEL fs pulses

I. Milov; I.A. Makhotkin; H. Enkisch; R. Sobierajski; J. Chalupsky; K. Tiedtke; Gosse de Vries; F. Scholze; F. Siewert; M. Störmer; R.W.E. van de Kruijs; E.G. Keim; H.A.G.M. van Wolferen; I. Yatsyna; M. Jurek; L. Juha; V. Hajkova; V. Vozda; T. Burian; K. Saksl; B. Faatz; B. Keitel; E. Ploenjes; S. Schreiber; S. Toleikis; R.A. Loch; M. Hermann; S. Strobel; H. Nienhuys; Eric Louis; F. Bijkerk

Single-shot damage of Ru thin film induced by FEL fs pulses

I. Milov, I.A. Makhotkin, H. Enkisch, R. Sobierajski, J. Chalupsky, K. Tiedtke, Gosse de Vries, F. Scholze, F. Siewert, M. Störmer, R.W.E. van de Kruijs, E.G. Keim, H.A.G.M. van Wolferen, I. Yatsyna, M. Jurek, L. Juha, V. Hajkova, V. Vozda, T. Burian, K. SakslB. Faatz, B. Keitel, E. Ploenjes, S. Schreiber, S. Toleikis, R.A. Loch, M. Hermann, S. Strobel, H. Nienhuys, Eric Louis, F. Bijkerk

XUV Optics

Research output: Contribution to conference › Poster › Other research output

Original language	English
Number of pages	1
Publication status	Published - 10 Nov 2016
Event	LEELIS-II workshop 2016 (Low-energy electrons: Lithography, Imaging, and Soft Matter) - Amsterdam Duration: 10 Nov 2016 → 11 Nov 2016

Conference

Conference	LEELIS-II workshop 2016 (Low-energy electrons: Lithography, Imaging, and Soft Matter)
City	Amsterdam
Period	10/11/16 → 11/11/16

Cite this

Milov, I., Makhotkin, I. A., Enkisch, H., Sobierajski, R., Chalupsky, J., Tiedtke, K., de Vries, G., Scholze, F., Siewert, F., Störmer, M., van de Kruijs, R. W. E., Keim, E. G., van Wolferen, H. A. G. M., Yatsyna, I., Jurek, M., Juha, L., Hajkova, V., Vozda, V., Burian, T., ... Bijkerk, F. (2016). Single-shot damage of Ru thin film induced by FEL fs pulses. Poster session presented at LEELIS-II workshop 2016 (Low-energy electrons: Lithography, Imaging, and Soft Matter), Amsterdam.

@conference{4e81dec9af494ff3bff1c1709d82285f,

title = "Single-shot damage of Ru thin film induced by FEL fs pulses",

author = "I. Milov and I.A. Makhotkin and H. Enkisch and R. Sobierajski and J. Chalupsky and K. Tiedtke and {de Vries}, Gosse and F. Scholze and F. Siewert and M. St{\"o}rmer and {van de Kruijs}, R.W.E. and E.G. Keim and {van Wolferen}, H.A.G.M. and I. Yatsyna and M. Jurek and L. Juha and V. Hajkova and V. Vozda and T. Burian and K. Saksl and B. Faatz and B. Keitel and E. Ploenjes and S. Schreiber and S. Toleikis and R.A. Loch and M. Hermann and S. Strobel and H. Nienhuys and Eric Louis and F. Bijkerk",

year = "2016",

month = nov,

day = "10",

language = "English",

note = "LEELIS-II workshop 2016 (Low-energy electrons: Lithography, Imaging, and Soft Matter) ; Conference date: 10-11-2016 Through 11-11-2016",

}

Milov, I, Makhotkin, IA, Enkisch, H, Sobierajski, R, Chalupsky, J, Tiedtke, K, de Vries, G, Scholze, F, Siewert, F, Störmer, M, van de Kruijs, RWE, Keim, EG, van Wolferen, HAGM, Yatsyna, I, Jurek, M, Juha, L, Hajkova, V, Vozda, V, Burian, T, Saksl, K, Faatz, B, Keitel, B, Ploenjes, E, Schreiber, S, Toleikis, S, Loch, RA, Hermann, M, Strobel, S, Nienhuys, H, Louis, E & Bijkerk, F 2016, 'Single-shot damage of Ru thin film induced by FEL fs pulses', LEELIS-II workshop 2016 (Low-energy electrons: Lithography, Imaging, and Soft Matter), Amsterdam, 10/11/16 - 11/11/16.

TY - CONF

T1 - Single-shot damage of Ru thin film induced by FEL fs pulses

AU - Milov, I.

AU - Makhotkin, I.A.

AU - Enkisch, H.

AU - Sobierajski, R.

AU - Chalupsky, J.

AU - Tiedtke, K.

AU - de Vries, Gosse

AU - Scholze, F.

AU - Siewert, F.

AU - Störmer, M.

AU - van de Kruijs, R.W.E.

AU - Keim, E.G.

AU - van Wolferen, H.A.G.M.

AU - Yatsyna, I.

AU - Jurek, M.

AU - Juha, L.

AU - Hajkova, V.

AU - Vozda, V.

AU - Burian, T.

AU - Saksl, K.

AU - Faatz, B.

AU - Keitel, B.

AU - Ploenjes, E.

AU - Schreiber, S.

AU - Toleikis, S.

AU - Loch, R.A.

AU - Hermann, M.

AU - Strobel, S.

AU - Nienhuys, H.

AU - Louis, Eric

AU - Bijkerk, F.

PY - 2016/11/10

Y1 - 2016/11/10

M3 - Poster

T2 - LEELIS-II workshop 2016 (Low-energy electrons: Lithography, Imaging, and Soft Matter)

Y2 - 10 November 2016 through 11 November 2016

ER -