Single-shot damage of Ru thin film induced by FEL fs pulses

Igor Milov, Igor Alexandrovich Makhotkin, H. Enkisch, R. Sobierajski, J. Chalupsky, K. Tiedtke, Gosse de Vries, F. Scholze, F. Siewert, M. Störmer, Robbert Wilhelmus Elisabeth van de Kruijs, E.G. Keim, Hendricus A.G.M. van Wolferen, I. Yatsyna, M. Jurek, L. Juha, V. Hajkova, V. Vozda, T. Burian, K. SakslB. Faatz, B. Keitel, E. Ploenjes, S. Schreiber, S. Toleikis, R.A. Loch, M. Hermann, S. Strobel, H. Nienhuys, Eric Louis, Frederik Bijkerk

Research output: Contribution to conferencePosterOther research output

Original languageEnglish
Pages-
Publication statusPublished - 10 Nov 2016
EventLEELIS-II workshop 2016 (Low-energy electrons: Lithography, Imaging, and Soft Matter) - Amsterdam
Duration: 10 Nov 201611 Nov 2016

Conference

ConferenceLEELIS-II workshop 2016 (Low-energy electrons: Lithography, Imaging, and Soft Matter)
CityAmsterdam
Period10/11/1611/11/16

Keywords

  • METIS-318793

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