Abstract
The use of integrated optics for Optical Coherence Tomography (OCT) can offer significant cost reductions and new applications. We designed, fabricated, and characterized Silicon oxynitride (SiON) elliptic couplers that are used to focus light from a chip into the off-chip environment. Fizeau-based OCT measurements are performed and compared to calculations.
Original language | English |
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Title of host publication | 15th European Conference on Integrated Optics (ECIO 2010) |
Place of Publication | UK |
Publisher | IEEE |
Pages | ThP23 |
Number of pages | 2 |
ISBN (Print) | not assigned |
Publication status | Published - 2010 |
Event | 15th European Conference on Integrated Optics, ECIO 2010 - University of Cambridge, Cambridge, United Kingdom Duration: 7 Apr 2010 → 9 Apr 2010 Conference number: 15 |
Publication series
Name | |
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Publisher | IEEE Photonics Society |
Conference
Conference | 15th European Conference on Integrated Optics, ECIO 2010 |
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Abbreviated title | ECIO |
Country/Territory | United Kingdom |
City | Cambridge |
Period | 7/04/10 → 9/04/10 |
Keywords
- METIS-276732
- IR-75256
- Optical Coherence Tomography
- Integrated Optics
- EWI-19073
- elliptic coupler