SiON integrated optics elliptic couplers for Fizeau-based Optical Coherence Tomography

V.D. Nguyen, Ton van Leeuwen, T.J. van Leeuwen, J. Kalkman, N. Ismail, F. Sun, B.I. Akça, A. Driessen, Markus Pollnau, R.M. de Ridder, Kerstin Worhoff

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

10 Citations (Scopus)
90 Downloads (Pure)

Abstract

The use of integrated optics for Optical Coherence Tomography (OCT) can offer significant cost reductions and new applications. We designed, fabricated, and characterized Silicon oxynitride (SiON) elliptic couplers that are used to focus light from a chip into the off-chip environment. Fizeau-based OCT measurements are performed and compared to calculations.
Original languageEnglish
Title of host publication15th European Conference on Integrated Optics (ECIO 2010)
Place of PublicationUK
PublisherIEEE Photonics Society
PagesThP23
Number of pages2
ISBN (Print)not assigned
Publication statusPublished - 2010
Event15th European Conference on Integrated Optics, ECIO 2010 - University of Cambridge, Cambridge, United Kingdom
Duration: 7 Apr 20109 Apr 2010
Conference number: 15

Publication series

Name
PublisherIEEE Photonics Society

Conference

Conference15th European Conference on Integrated Optics, ECIO 2010
Abbreviated titleECIO
CountryUnited Kingdom
CityCambridge
Period7/04/109/04/10

Keywords

  • METIS-276732
  • IR-75256
  • Optical Coherence Tomography
  • Integrated Optics
  • EWI-19073
  • elliptic coupler

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