Small amplitude atomic force spectroscopy

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

Abstract

Over the years atomic force microscopy has developed from a pure imaging technique to a tool that can be employed for measuring quantitative tip–sample interaction forces. In this chapter we provide an overview of various techniques to extract quantitative tip–sample forces focusing on both amplitude modulation and frequency modulation atomic force spectroscopy (AM-AFS and FM-AFS) in the small amplitude regime. We discuss different actuation methods, such as sample modulation, magnetic actuation, and by far the most widely used acoustic driving. Also the corresponding force-inversion methodology is discussed for – in particular – ambient liquid.
Original languageEnglish
Title of host publicationScanning Probe Microscopy in Nanoscience and Nanotechnology 2
EditorsBharat Bhushan
Place of PublicationBerlin, Heidelberg
PublisherSpringer
Pages39-58
ISBN (Print)978-3-642-10496-1
DOIs
Publication statusPublished - 2011

Publication series

NameNanoScience and Technology
PublisherSpringer
ISSN (Print)1434-4904

Fingerprint

actuation
frequency modulation
spectroscopy
modulation
imaging techniques
atomic force microscopy
methodology
inversions
acoustics
liquids
interactions

Keywords

  • IR-98051
  • METIS-273212

Cite this

de Beer, S., van den Ende, H. T. M., Ebeling, D., & Mugele, F. G. (2011). Small amplitude atomic force spectroscopy. In B. Bhushan (Ed.), Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 (pp. 39-58). (NanoScience and Technology). Berlin, Heidelberg: Springer. https://doi.org/10.1007/978-3-642-10497-8_2
de Beer, Sissi ; van den Ende, Henricus T.M. ; Ebeling, Daniel ; Mugele, Friedrich Gunther. / Small amplitude atomic force spectroscopy. Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. editor / Bharat Bhushan. Berlin, Heidelberg : Springer, 2011. pp. 39-58 (NanoScience and Technology).
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de Beer, S, van den Ende, HTM, Ebeling, D & Mugele, FG 2011, Small amplitude atomic force spectroscopy. in B Bhushan (ed.), Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. NanoScience and Technology, Springer, Berlin, Heidelberg, pp. 39-58. https://doi.org/10.1007/978-3-642-10497-8_2

Small amplitude atomic force spectroscopy. / de Beer, Sissi; van den Ende, Henricus T.M.; Ebeling, Daniel; Mugele, Friedrich Gunther.

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. ed. / Bharat Bhushan. Berlin, Heidelberg : Springer, 2011. p. 39-58 (NanoScience and Technology).

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

TY - CHAP

T1 - Small amplitude atomic force spectroscopy

AU - de Beer, Sissi

AU - van den Ende, Henricus T.M.

AU - Ebeling, Daniel

AU - Mugele, Friedrich Gunther

PY - 2011

Y1 - 2011

N2 - Over the years atomic force microscopy has developed from a pure imaging technique to a tool that can be employed for measuring quantitative tip–sample interaction forces. In this chapter we provide an overview of various techniques to extract quantitative tip–sample forces focusing on both amplitude modulation and frequency modulation atomic force spectroscopy (AM-AFS and FM-AFS) in the small amplitude regime. We discuss different actuation methods, such as sample modulation, magnetic actuation, and by far the most widely used acoustic driving. Also the corresponding force-inversion methodology is discussed for – in particular – ambient liquid.

AB - Over the years atomic force microscopy has developed from a pure imaging technique to a tool that can be employed for measuring quantitative tip–sample interaction forces. In this chapter we provide an overview of various techniques to extract quantitative tip–sample forces focusing on both amplitude modulation and frequency modulation atomic force spectroscopy (AM-AFS and FM-AFS) in the small amplitude regime. We discuss different actuation methods, such as sample modulation, magnetic actuation, and by far the most widely used acoustic driving. Also the corresponding force-inversion methodology is discussed for – in particular – ambient liquid.

KW - IR-98051

KW - METIS-273212

U2 - 10.1007/978-3-642-10497-8_2

DO - 10.1007/978-3-642-10497-8_2

M3 - Chapter

SN - 978-3-642-10496-1

T3 - NanoScience and Technology

SP - 39

EP - 58

BT - Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

A2 - Bhushan, Bharat

PB - Springer

CY - Berlin, Heidelberg

ER -

de Beer S, van den Ende HTM, Ebeling D, Mugele FG. Small amplitude atomic force spectroscopy. In Bhushan B, editor, Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. Berlin, Heidelberg: Springer. 2011. p. 39-58. (NanoScience and Technology). https://doi.org/10.1007/978-3-642-10497-8_2