@inbook{ff2a78ef221e428d80ae470e91c51b7a,
title = "Small amplitude atomic force spectroscopy",
abstract = "Over the years atomic force microscopy has developed from a pure imaging technique to a tool that can be employed for measuring quantitative tip{\textendash}sample interaction forces. In this chapter we provide an overview of various techniques to extract quantitative tip{\textendash}sample forces focusing on both amplitude modulation and frequency modulation atomic force spectroscopy (AM-AFS and FM-AFS) in the small amplitude regime. We discuss different actuation methods, such as sample modulation, magnetic actuation, and by far the most widely used acoustic driving. Also the corresponding force-inversion methodology is discussed for {\textendash} in particular {\textendash} ambient liquid.",
keywords = "IR-98051, METIS-273212",
author = "\{de Beer\}, Sissi and \{van den Ende\}, \{Henricus T.M.\} and Daniel Ebeling and Mugele, \{Friedrich Gunther\}",
year = "2011",
doi = "10.1007/978-3-642-10497-8\_2",
language = "English",
isbn = "978-3-642-10496-1",
series = "NanoScience and Technology",
publisher = "Springer",
pages = "39--58",
editor = "Bharat Bhushan",
booktitle = "Scanning Probe Microscopy in Nanoscience and Nanotechnology 2",
address = "Germany",
}