Smarter concepts for future EMI standards

Iwan Setiawan, Cornelis H.A. Keyer, Frank Leferink

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    4 Citations (Scopus)
    2 Downloads (Pure)


    Conflicts of interest in determining permitted levels of EMI of electronic products between different standard committees result in a deadlock. In this context, the conventional approach used in defining the levels is not sufficient anymore to overcome contemporary EMI cases due to technology which rapidly advances. On the other hand, customers need to be protected by EMI standards which must adapt to this change. In the case of smart grids, the challenge is how to manage coexistence between the advanced electronics and communication services without the need to first eliminate interfering signals to allow power line telecommunication (PLT) which is at the same time an interfering signal. To reach this goal, we propose a novel approach for achieving EMC (EM compatibility) by using limits in both the time and the frequency domain while considering PLT as a boundary condition instead of using conventional EMI standards which are based on frequency domain limits only.
    Original languageEnglish
    Title of host publication2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC 2017)
    Subtitle of host publication June 20-23, 2017, The Commons, Yonsei University, Seoul, Korea
    Place of PublicationPiscataway, NJ
    Number of pages3
    ISBN (Electronic)978-1-5386-3912-2
    ISBN (Print)978-1-5386-3913-9
    Publication statusPublished - 13 Jul 2017
    Event2017 IEEE Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2017 - The Commons, Yonsie University, Seoul, Korea, Republic of
    Duration: 20 Jun 201723 Jun 2017


    Conference2017 IEEE Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2017
    Abbreviated titleAPEMC
    Country/TerritoryKorea, Republic of


    Dive into the research topics of 'Smarter concepts for future EMI standards'. Together they form a unique fingerprint.

    Cite this