@inproceedings{e010dc4a91814690832e5c0d1add5fcb,
title = "SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life",
abstract = "The ever shrinking technology dimensions have increased the degradation levels in integrated mixed-signal circuits mainly because of issues that were not considered in older technologies. These issues have posed new challenges and require a complete strategy starting from the design phase of the product to the end-of-life. This paper presents such a strategy starting with an early selection of dependable blocks at IP level and combines this with an efficient hardware platform architecture to address lifetime dependability issues especially for mixed-signal frontends. The proposed approach links the circuit/IP level dependability with the block level dependability enhancement and finally with the system level dependability enhancement strategy. The approach is supported by extensive simulations and provides confidence in using the proposed strategy.",
keywords = "METIS-281618, Mixed-signal dependability, IR-78791, hardware redundancy, dependability characterization, self-diagnosis, dependable IPs, design space exploration for dependable system, EWI-20936, CAES-TDT: Testable Design and Test, dependability recovery scheme",
author = "M.A. Khan and Kerkhoff, {Hans G.}",
note = "10.1109/DFT.2011.62 ; 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011 ; Conference date: 03-10-2011 Through 05-10-2011",
year = "2011",
doi = "10.1109/DFT.2011.62",
language = "Undefined",
isbn = "978-0-7695-4556-1",
publisher = "IEEE",
pages = "374--381",
booktitle = "24th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems",
address = "United States",
}