SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life

M.A. Khan, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    3 Citations (Scopus)

    Abstract

    The ever shrinking technology dimensions have increased the degradation levels in integrated mixed-signal circuits mainly because of issues that were not considered in older technologies. These issues have posed new challenges and require a complete strategy starting from the design phase of the product to the end-of-life. This paper presents such a strategy starting with an early selection of dependable blocks at IP level and combines this with an efficient hardware platform architecture to address lifetime dependability issues especially for mixed-signal frontends. The proposed approach links the circuit/IP level dependability with the block level dependability enhancement and finally with the system level dependability enhancement strategy. The approach is supported by extensive simulations and provides confidence in using the proposed strategy.
    Original languageUndefined
    Title of host publication24th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
    Place of PublicationUSA
    PublisherIEEE Computer Society
    Pages374-381
    Number of pages8
    ISBN (Print)978-0-7695-4556-1
    DOIs
    Publication statusPublished - 2011
    Event2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011 - Marriott Pinnacle Hotel, Vancouver, Canada
    Duration: 3 Oct 20115 Oct 2011

    Publication series

    Name
    PublisherIEEE Computer Society
    ISSN (Print)1550-5774

    Conference

    Conference2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011
    Abbreviated titleDFT
    CountryCanada
    CityVancouver
    Period3/10/115/10/11

    Keywords

    • METIS-281618
    • Mixed-signal dependability
    • IR-78791
    • hardware redundancy
    • dependability characterization
    • self-diagnosis
    • dependable IPs
    • design space exploration for dependable system
    • EWI-20936
    • CAES-TDT: Testable Design and Test
    • dependability recovery scheme

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