SoCs with MEMS: Can we include MEMS in the SoC design and test flow?

Hans G. Kerkhoff, S. Mir

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings IEEE VLSI Test Symposium (VTS)
    Place of PublicationMonterey, USA
    Publication statusPublished - 1 Apr 2002


    • METIS-208712

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