SoCs with MEMS: Can we include MEMS in the SoC design and test flow?

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    Original languageUndefined
    Title of host publicationProceedings IEEE VLSI Test Symposium (VTS)
    Place of PublicationMonterey, USA
    Pages449-
    Publication statusPublished - 1 Apr 2002

    Keywords

    • METIS-208712

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