SoCs with MEMS: Can we include MEMS in the SoC design and test flow?

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings IEEE VLSI Test Symposium (VTS)
Place of Publication	Monterey, USA
Pages	449-
Publication status	Published - 1 Apr 2002

Keywords

@inproceedings{1aeaf0e7d74e4d7e9a5acf9414471ae9,

title = "SoCs with MEMS: Can we include MEMS in the SoC design and test flow?",

keywords = "METIS-208712",

author = "Kerkhoff, {Hans G.} and S. Mir",

year = "2002",

month = apr,

day = "1",

language = "Undefined",

isbn = "0-7695-1570-3",

pages = "449--",

booktitle = "Proceedings IEEE VLSI Test Symposium (VTS)",

}