SoCs with MEMS: Can we include MEMS in the SoC design and test flow?

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    Original languageUndefined
    Title of host publicationProceedings IEEE VLSI Test Symposium (VTS)
    Place of PublicationMonterey, USA
    Pages449-
    Publication statusPublished - 1 Apr 2002

    Keywords

    • METIS-208712

    Cite this

    Kerkhoff, H. G., & Mir, S. (2002). SoCs with MEMS: Can we include MEMS in the SoC design and test flow? In Proceedings IEEE VLSI Test Symposium (VTS) (pp. 449-). Monterey, USA.