Some alternatives to Sympson-Hetter item-exposure control in computerized adaptive testing

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Abstract

The Sympson and Hetter (SH; J. Sympson and R. Hetter; 1985;1997) method is a method of probabilistic item exposure control in computerized adaptive testing. Setting its control parameters to admissible values requires an iterative process of computer simulations that has been found to be time consuming, particularly if the parameters have to be set conditional on a realistic set of values for the examinees' ability parameter. Formal properties of the method are identified that help us explain why this iterative process can be slow and does not guarantee admissibility. In addition, some alternatives to the SH method are introduced. The behavior of these alternatives was estimated for an adaptive test from an item pool from the Law School Admission Test. Two of the alternatives showed attractive behavior and converged smoothly to admissibility for all items in a relatively small number of iteration steps.
Original languageEnglish
Place of PublicationEnschede
PublisherOnderwijskundige Meetmethoden en Data-analyse
Number of pages31
Publication statusPublished - 2002

Publication series

NameOMD Research Report
PublisherUniversity of Twente, Faculty of Educational Science and Technology
No.02-02

Fingerprint

computer simulation
method
exposure
parameter
test
school

Keywords

  • METIS-209500
  • IR-103554

Cite this

van der Linden, W. J. (2002). Some alternatives to Sympson-Hetter item-exposure control in computerized adaptive testing. (OMD Research Report; No. 02-02). Enschede: Onderwijskundige Meetmethoden en Data-analyse.
van der Linden, Willem J. / Some alternatives to Sympson-Hetter item-exposure control in computerized adaptive testing. Enschede : Onderwijskundige Meetmethoden en Data-analyse, 2002. 31 p. (OMD Research Report; 02-02).
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van der Linden, WJ 2002, Some alternatives to Sympson-Hetter item-exposure control in computerized adaptive testing. OMD Research Report, no. 02-02, Onderwijskundige Meetmethoden en Data-analyse, Enschede.

Some alternatives to Sympson-Hetter item-exposure control in computerized adaptive testing. / van der Linden, Willem J.

Enschede : Onderwijskundige Meetmethoden en Data-analyse, 2002. 31 p. (OMD Research Report; No. 02-02).

Research output: Book/ReportReportProfessional

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van der Linden WJ. Some alternatives to Sympson-Hetter item-exposure control in computerized adaptive testing. Enschede: Onderwijskundige Meetmethoden en Data-analyse, 2002. 31 p. (OMD Research Report; 02-02).