Spatial modelling of rice yield losses due to bacterial leaf blight and leaf blast in a changing climate

Adam H. Sparks, Confidence Duku, Jorrel Khalil Aunario, S.J. Zwart

Research output: Contribution to conferenceAbstractOther research output

Original languageEnglish
Publication statusPublished - 2013
Externally publishedYes
Event10th International congress of plant pathology - Beijing, China
Duration: 25 Aug 201330 Aug 2013

Conference

Conference10th International congress of plant pathology
CountryChina
CityBeijing
Period25/08/1330/08/13

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